欢迎访问ic37.com |
会员登录 免费注册
发布采购

MT41J256M4 参数 Datasheet PDF下载

MT41J256M4图片预览
型号: MT41J256M4
PDF下载: 下载PDF文件 查看货源
内容描述: DDR3 SDRAM MT41J256M4 â ????梅格32 ×4× 8银行MT41J128M8 â ????梅格16 ×8× 8银行MT41J64M16 â ???? 8梅格×16× 8银行 [DDR3 SDRAM MT41J256M4 – 32 Meg x 4 x 8 banks MT41J128M8 – 16 Meg x 8 x 8 banks MT41J64M16 – 8 Meg x 16 x 8 banks]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 214 页 / 2938 K
品牌: MICRON [ MICRON TECHNOLOGY ]
 浏览型号MT41J256M4的Datasheet PDF文件第155页浏览型号MT41J256M4的Datasheet PDF文件第156页浏览型号MT41J256M4的Datasheet PDF文件第157页浏览型号MT41J256M4的Datasheet PDF文件第158页浏览型号MT41J256M4的Datasheet PDF文件第160页浏览型号MT41J256M4的Datasheet PDF文件第161页浏览型号MT41J256M4的Datasheet PDF文件第162页浏览型号MT41J256M4的Datasheet PDF文件第163页  
1Gb: x4, x8, x16 DDR3 SDRAM  
READ Operation  
READ Operation  
READ bursts are initiated with a READ command. The starting column and bank ad-  
dresses are provided with the READ command and auto precharge is either enabled or  
disabled for that burst access. If auto precharge is enabled, the row being accessed is  
automatically precharged at the completion of the burst. If auto precharge is disabled,  
the row will be left open after the completion of the burst.  
During READ bursts, the valid data-out element from the starting column address is  
available READ latency (RL) clocks later. RL is defined as the sum of posted CAS additive  
latency (AL) and CAS latency (CL) (RL = AL + CL). The value of AL and CL is programma-  
ble in the mode register via the MRS command. Each subsequent data-out element is  
valid nominally at the next positive or negative clock edge (that is, at the next crossing  
of CK and CK#). Figure 68 shows an example of RL based on a CL setting of 8 and an AL  
setting of ±.  
Figure 68: READ Latency  
T0  
T7  
T8  
T9  
T10  
T11  
T12  
T12  
CK#  
CK  
Command  
READ  
NOP  
NOP  
NOP  
NOP  
NOP  
NOP  
NOP  
Bank a,  
Col n  
Address  
CL = 8, AL = 0  
DQS, DQS#  
DQ  
DO  
n
Indicates break  
in time scale  
Transitioning Data  
Don’t Care  
1. DO n = data-out from column n.  
Notes:  
2. Subsequent elements of data-out appear in the programmed order following DO n.  
DQS, DQS# is driven by the DRAM along with the output data. The initial LOW state on  
DQS and HIGH state on DQS# is known as the READ preamble (tRPRE). The LOW state  
on DQS and the HIGH state on DQS#, coincident with the last data-out element, is  
known as the READ postamble (tRPST). Upon completion of a burst, assuming no other  
commands have been initiated, the DQ goes High-Z. A detailed explanation of tDQSQ  
(valid data-out skew), tQH (data-out window hold), and the valid data window are de-  
picted in Figure 09 (page 160). A detailed explanation of tDQSCK (DQS transition skew  
to CK) is also depicted in Figure 09 (page 160).  
Data from any READ burst may be concatenated with data from a subsequent READ  
command to provide a continuous flow of data. The first data element from the new  
burst follows the last element of a completed burst. The new READ command should be  
issued tCCD cycles after the first READ command. This is shown for BL8 in Figure 69  
(page 161). If BC4 is enabled, tCCD must still be met, which will cause a gap in the data  
output, as shown in Figure 0± (page 161). Nonconsecutive READ data is reflected in  
PDF: 09005aef826aa906  
1Gb_DDR3_SDRAM.pdf - Rev. L 03/13 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
159  
‹ 2006 Micron Technology, Inc. All rights reserved.  
 复制成功!