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JS28F256P33BFE 参数 Datasheet PDF下载

JS28F256P33BFE图片预览
型号: JS28F256P33BFE
PDF下载: 下载PDF文件 查看货源
内容描述: NumonyxTM的StrataFlash嵌入式存储器 [NumonyxTM StrataFlash Embedded Memory]
分类和应用: 闪存存储内存集成电路光电二极管
文件页数/大小: 90 页 / 1067 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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P33-65nm  
to issue 70h to read SR data after E8h command otherwise 70h would be counted as  
Word Count.  
On the next write, a word count is written to the device at the buffer address. This tells  
the device how many data words will be written to the buffer, up to the maximum size  
of the buffer.  
On the next write, a device start address is given along with the first data to be written  
to the flash memory array. Subsequent writes provide additional device addresses and  
data. All data addresses must lie within the start address plus the word count.  
Optimum programming performance and lower power usage are obtained by aligning  
the starting address at the beginning of a 512-word boundary (A[9:1] = 0x00). The  
maximum buffer size would be 256-word if the misaligned address range is crossing a  
512-word boundary during programming.  
After the last data is written to the buffer, the Buffered Programming Confirm command  
must be issued to the original block address. The WSM begins to program buffer  
contents to the flash memory array. If a command other than the Buffered  
Programming Confirm command is written to the device, a command sequence error  
occurs and SR[7,5,4] are set. If an error occurs while writing to the array, the device  
stops programming, and SR[7,4] are set, indicating a programming failure.  
When Buffered Programming has completed, additional buffer writes can be initiated by  
issuing another Buffered Programming Setup command and repeating the buffered  
program sequence. Buffered programming may be performed with VPP = VPPL or VPPH  
(see Section 13.2, “Operating Conditions” on page 45 for limitations when operating  
the device with VPP = VPPH).  
If an attempt is made to program past an erase-block boundary using the Buffered  
Program command, the device aborts the operation. This generates a command  
sequence error, and SR[5,4] are set.  
If Buffered programming is attempted while VPP is below VPPLK, SR[4,3] are set. If any  
errors are detected that have set Status Register bits, the Status Register should be  
cleared using the Clear Status Register command.  
8.3  
Buffered Enhanced Factory Programming  
Buffered Enhanced Factory Programing (BEFP) speeds up Multi-Level Cell (MLC) flash  
programming. The enhanced programming algorithm used in BEFP eliminates  
traditional programming elements that drive up overhead in device programmer  
systems. (see Figure 34, “BEFP Flowchart” on page 75).  
BEFP consists of three phases: Setup, Program/Verify, and Exit It uses a write buffer to  
spread MLC program performance across 512 data words. Verification occurs in the  
same phase as programming to accurately program the flash memory cell to the  
correct bit state.  
A single two-cycle command sequence programs the entire block of data. This  
enhancement eliminates three write cycles per buffer: two commands and the word  
count for each set of 512 data words. Host programmer bus cycles fill the device’s write  
buffer followed by a status check. SR.0 indicates when data from the buffer has been  
programmed into sequential flash memory array locations.  
Following the buffer-to-flash array programming sequence, the Write State Machine  
(WSM) increments internal addressing to automatically select the next 512-word array  
boundary. This aspect of BEFP saves host programming equipment the address-bus  
setup overhead.  
Datasheet  
24  
Aug 2009  
Order Number: 320003-08  
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