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PIC16F73-I/SPG 参数 Datasheet PDF下载

PIC16F73-I/SPG图片预览
型号: PIC16F73-I/SPG
PDF下载: 下载PDF文件 查看货源
内容描述: [28 Pin, 7KB Std Flash, 192 RAM, 22 I/O, -40C to +85C, 28-SPDIP, TUBE]
分类和应用: 闪存微控制器
文件页数/大小: 174 页 / 3853 K
品牌: MICROCHIP [ MICROCHIP ]
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PIC16F7X  
This interrupt can wake the device from SLEEP. The  
user, in the Interrupt Service Routine, can clear the  
interrupt in the following manner:  
4.2  
PORTB and the TRISB Register  
PORTB is an 8-bit wide, bi-directional port. The corre-  
sponding data direction register is TRISB. Setting a  
TRISB bit (= 1) will make the corresponding PORTB  
pin an input (i.e., put the corresponding output driver in  
a Hi-Impedance mode). Clearing a TRISB bit (= 0) will  
make the corresponding PORTB pin an output (i.e., put  
the contents of the output latch on the selected pin).  
a) Any read or write of PORTB. This will end the  
mismatch condition.  
b) Clear flag bit RBIF.  
A mismatch condition will continue to set flag bit RBIF.  
Reading PORTB will end the mismatch condition and  
allow flag bit RBIF to be cleared.  
Each of the PORTB pins has a weak internal pull-up. A  
single control bit can turn on all the pull-ups. This is per-  
formed by clearing bit RBPU (OPTION_REG<7>). The  
weak pull-up is automatically turned off when the port  
pin is configured as an output. The pull-ups are dis-  
abled on a Power-on Reset.  
The interrupt-on-change feature is recommended for  
wake-up on key depression operation and operations  
where PORTB is only used for the interrupt-on-change  
feature. Polling of PORTB is not recommended while  
using the interrupt-on-change feature.  
This interrupt on mismatch feature, together with soft-  
ware configureable pull-ups on these four pins, allow  
easy interface to a keypad and make it possible for  
wake-up on key depression. Refer to the Embedded  
Control Handbook, Implementing Wake-up on Key  
Stroke(AN552).  
FIGURE 4-3:  
BLOCK DIAGRAM OF  
RB3:RB0 PINS  
VDD  
RBPU(2)  
Weak  
Pull-up  
P
Data Latch  
RB0/INT is an external interrupt input pin and is config-  
ured using the INTEDG bit (OPTION_REG<6>).  
Data Bus  
WR Port  
D
Q
I/O  
pin(1)  
RB0/INT is discussed in detail in Section 12.11.1.  
CK  
TRIS Latch  
FIGURE 4-4:  
BLOCK DIAGRAM OF  
RB7:RB4 PINS  
D
Q
TTL  
Input  
Buffer  
WR TRIS  
CK  
VDD  
RBPU(2)  
Weak  
P
Pull-up  
RD TRIS  
RD Port  
RB0/INT  
Data Latch  
Data Bus  
WR Port  
D
Q
Q
D
I/O  
pin(1)  
CK  
TRIS Latch  
EN  
D
Q
WR TRIS  
RD TRIS  
TTL  
Input  
Buffer  
Schmitt Trigger  
Buffer  
RD Port  
CK  
ST  
Buffer  
Note 1: I/O pins have diode protection to VDD and VSS.  
2: To enable weak pull-ups, set the appropriate TRIS  
bit(s) and clear the RBPU bit (OPTION_REG<7>).  
Latch  
Q
Q
D
Four of the PORTB pins (RB7:RB4) have an inter-  
rupt-on-change feature. Only pins configured as inputs  
can cause this interrupt to occur (i.e., any RB7:RB4 pin  
configured as an output is excluded from the inter-  
rupt-on-change comparison). The input pins (of  
RB7:RB4) are compared with the old value latched on  
the last read of PORTB. The mismatchoutputs of  
RB7:RB4 are ORed together to generate the RB Port  
Change Interrupt with flag bit RBIF (INTCON<0>).  
RD Port  
EN  
Q1  
Set RBIF  
D
RD Port  
Q3  
From other  
RB7:RB4 pins  
EN  
RB7:RB6 in Serial Programming mode  
Note 1: I/O pins have diode protection to VDD and VSS.  
2: To enable weak pull-ups, set the appropriate TRIS bit(s)  
and clear the RBPU bit (OPTION_REG<7>).  
2002 Microchip Technology Inc.  
DS30325B-page 33