MCP201
2.0
2.1
ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings†
VIN DC Voltage on Logic pins except CS/WAKE .................................................................................-0.3 to VREG+0.3V
VIN DC Voltage on CS/WAKE ...............................................................................................................-0.3 to VBAT+0.3V
VBAT Battery Voltage, non-operating (LIN bus recessive, no regulator load, t < 60s)....................................-0.3 to +40V
VBAT Battery Voltage, transient (Note 1)........................................................................................................-0.3 to +40V
VBAT Battery Voltage, continuous ..................................................................................................................-0.3 to +30V
VLBUS Bus Voltage, continuous.......................................................................................................................-18 to +30V
VLBUS Bus Voltage, transient (Note 1)............................................................................................................-27 to +40V
ILBUS Bus Short Circuit Current Limit....................................................................................................................200 mA
ESD protection on LIN, VBAT (Human Body Model) (Note 2)..................................................................................>4 kV
ESD protection on all other pins (Human Body Model) (Note 2) .............................................................................>2 kV
Maximum Junction Temperature............................................................................................................................. 150°C
Storage Temperature ..................................................................................................................................-55 to +150°C
Note 1: ISO 7637/1 load dump compliant (t < 500 ms).
2: According to JESD22-A114-B.
† NOTICE: Stresses above those listed under “Maximum Ratings” may cause permanent damage to the device. This
is a stress rating only and functional operation of the device at those or any other conditions above those indicated in
the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods
may affect device reliability.
© 2007 Microchip Technology Inc.
DS21730F-page 13
MICROCHIP [ MICROCHIP ]
