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MX26C1000BQI-12 参数 Datasheet PDF下载

MX26C1000BQI-12图片预览
型号: MX26C1000BQI-12
PDF下载: 下载PDF文件 查看货源
内容描述: 1M - BIT [ 128K ×8 ] CMOS多时间可编程EPROM [1M-BIT [128K x 8] CMOS MULTIPLE-TIME-PROGRAMMABLE-EPROM]
分类和应用: 闪存存储内存集成电路可编程只读存储器电动程控只读存储器
文件页数/大小: 23 页 / 987 K
品牌: Macronix [ MACRONIX INTERNATIONAL ]
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MX26C1000B  
EPROMTM is built on an innovative cell concept in which  
over erasing the memory cell is impossible.  
force 12.0 ±0.5 V on address line A9 of the device.  
Two identifier bytes may then be sequenced from the  
device outputs by toggling address line A0 from VIL to  
VIH. All other address lines must be held at VIL during  
auto identify mode.  
DATA WRITE PROTECTION  
Byte 0 ( A0 = VIL) represents the manufacturer code,  
and byte 1 (A0 = VIH), the device identifier code. For  
the MX26C1000B, these two identifier bytes are given  
intheModeSelectTable. Allidentifiersformanufacturer  
and device codes will possess odd parity, with the MSB  
(DQ7) defined as the parity bit.  
The design of the device protects against accidental  
erasure or programming. The internal state machine is  
automaticallyresettothereadmodeonpower-up.Using  
control register architecture, alteration of memory can  
only occur after completion of proper command  
sequences.ThecommandregisterisonlyactivewhenV  
PP isathighvoltage.whenVPP =VPPL ,thedevicedefaults  
to the Read Mode. Robust design features prevent  
inadvertentwritecyclesresultingfromVCC power-upand  
power-downtransitionsorsystemnoise.Toavoidinitiation  
ofwritecycleduringVCC power-up,awritecycleislocked  
outforVCC lessthan4V.Thetwo-commandprogramand  
erase write sequence to the command register provide  
additional software protection against spurious data  
changes.  
READ MODE  
The MX26C1000B has two control functions, both of  
which must be logically satisfied in order to obtain data  
at the outputs. Chip Enable (CE) is the power control  
and should be used for device selection. Output Enable  
(OE) is the output control and should be used to gate  
datatotheoutputpins, independentofdeviceselection.  
Assuming that addresses are stable, address access  
time(tACC)isequaltothedelayfromCEtooutput(tCE).  
DataisavailableattheoutputstOEafterthefallingedge  
of OE, assuming that CE has been LOW and addresses  
have been stable for at least tACC - tOE.  
PROGRAM VERIFY MODE  
Verificationshouldbeperformedontheprogrammedbits  
to determine that they were correctly programmed.  
Verification should be performed with OE and CE, at  
VIL, WE at VIH, and VPP at its programming voltage.  
STANDBY MODE  
The MX26C1000B has a CMOS standby mode which  
reduces the maximum VCC current to 100 uA. It is  
placed in CMOS standby when CE is at VCC ±0.3 V.  
The MX26C1000B also has a TTL-standby mode which  
reduces the maximum VCC current to 1.5 mA. It is  
placed in TTL-standby when CE is at VIH. When in  
standby mode, the outputs are in a high-impedance  
state, independent of the OE input.  
ERASE VERIFY MODE  
Verification should be performed on the erased chip to  
determine that the whole chip(all bits) was correctly  
erased. Verification should be performed with OE and  
CE at VIL, WE at VIH, and VCC = 5V, VPP = 12.5V  
AUTO IDENTIFY MODE  
SYSTEM CONSIDERATIONS  
Theautoidentifymodeallowsthereadingoutofabinary  
code from MTP EPROM that will identify its  
manufacturer and device type. This mode is intended  
for use by programming equipment for the purpose of  
automatically matching the device to be programmed  
with its corresponding programming algorithm. This  
modeisfunctionalinthe25°C±5°Cambienttemperature  
range that is required when programming the  
MX26C1000B.  
During the switch between active and standby  
conditions, transient current peaks are produced on the  
rising and falling edges of Chip Enable. The magnitude  
of these transient current peaks is dependent on the  
outputcapacitanceloadingofthedevice. Ataminimum,  
a0.1uFceramiccapacitor(highfrequency,lowinherent  
inductance) should be used on each device between  
VCCandGNDtominimizetransienteffects. Inaddition,  
to overcome the voltage drop caused by the inductive  
Toactivatethismode,theprogrammingequipmentmust  
REV. 0.6, OCT. 04, 2001  
P/N: PM0767  
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