MAX11120–MAX11128
1Msps, Low-Power, Serial 12-/10-/8-Bit,
4-/8-/16-Channel ADCs
into ADC memory, the pattern may be repeated indefi-
nitely or changed at any time.
the ADC can resolve (Nyquist Theorem) is 31.25kHz.
If all 16 channels must be measured, with some chan-
nels having greater than 31.25kHz input frequency, the
user must revert back to manual mode requiring con-
stant communication on the serial interface. SampleSet
technology solves this problem. Figure 9 provides a
SampleSet use-model example.
For example, the maximum throughput of MAX11120–
MAX11128 is 1Msps. Traditional ADC scan modes allow
up to 16-channel conversions in ascending order. In this
case, the effective throughput per channel is 1Msps/16
channel or 62.5ksps. The maximum input frequency that
SampleSet REPEATS: LENGTH = 256
SAMPLE SET
(DEPTH = 256)
ST
ND
RD
TH
TH
TH
TH
TH
TH
9 CYCLE
1
CYCLE
2
CYCLE
3
CYCLE
4
CYCLE
5
CYCLE
6
CYCLE
7
CYCLE
8
CYCLE
POTENTIAL SampleSet PATTERN
AIN2/
AIN2/
AIN3
AIN2/
AIN3
AIN2/
AIN3
CHANNEL:
AIN0
2
AIN1
3
AIN0
4
AIN1
5
AIN0
AIN1
AIN3
AIN4
123
AIN5
124
AIN6
125
AIN7
126
AIN8
127
AIN9
128
AIN10 AIN11 AIN12 AIN13 AIN14 AIN15
129 130 131 132 133 134
AIN0
136
AIN1
137
AIN0
254
AIN1
255
1
120
121
122
135
256
ENTRY NO.:
120 CONVERSIONS:
AIN0 AND AIN1
120 CONVERSIONS:
AIN0 AND AIN1
ANALOG
INPUTS
AIN0
AIN1
100kHz
100 CYCLES
135
AIN2
FULLY
DIFFERENTIAL
10kHz
10 CYCLES
1
AIN3
122
123
124
125
256
1kHz
1 CYCLES
AIN4
AIN5
AIN6
t
= 1/f = 1/1Msps = 100ns
S
S
AIN7
CS
10
AIN8
8
AIN0
12
6
14
4
AIN9
16
32
2
18
10µs
30
T
S
5µs
AIN10
AIN11
AIN12
AIN13
20
28
22
f
= 100kHz
26
in
24
9
11
AIN1
7
13
5
15
3
17
31
19
5µs
10µs
T
S
29
21
27
23
25
Figure 9. SampleSet Use-Model Example
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