欢迎访问ic37.com |
会员登录 免费注册
发布采购

DS2154LNA2+ 参数 Datasheet PDF下载

DS2154LNA2+图片预览
型号: DS2154LNA2+
PDF下载: 下载PDF文件 查看货源
内容描述: [Framer, CMOS, PQFP100, 14 X 14 MM, 1.40 MM HEIGHT, ROHS COMPLIANT, LQFP-100]
分类和应用: PC电信电信集成电路
文件页数/大小: 124 页 / 982 K
品牌: MAXIM [ MAXIM INTEGRATED PRODUCTS ]
 浏览型号DS2154LNA2+的Datasheet PDF文件第88页浏览型号DS2154LNA2+的Datasheet PDF文件第89页浏览型号DS2154LNA2+的Datasheet PDF文件第90页浏览型号DS2154LNA2+的Datasheet PDF文件第91页浏览型号DS2154LNA2+的Datasheet PDF文件第93页浏览型号DS2154LNA2+的Datasheet PDF文件第94页浏览型号DS2154LNA2+的Datasheet PDF文件第95页浏览型号DS2154LNA2+的Datasheet PDF文件第96页  
DS21354/DS21554 3.3V/5V E1 Single-Chip Transceivers  
TAP Controller State Machine  
The TAP controller is a finite state machine that responds to the logic level at JTMS on the rising edge of  
JTCLK. See Figure 16-2.  
Test-Logic-Reset  
Upon power up, the TAP Controller will be in the Test-Logic-Reset state. The Instruction register will  
contain the IDCODE instruction. All system logic of the device will operate normally.  
Run-Test-Idle  
The Run-Test-Idle is used between scan operations or during specific tests. The Instruction register and  
test registers will remain idle.  
Select-DR-Scan  
All test registers retain their previous state. With JTMS LOW, a rising edge of JTCLK moves the  
controller into the Capture-DR state and will initiate a scan sequence. JTMS HIGH during a rising edge  
on JTCLK moves the controller to the Select-IR-Scan state.  
Capture-DR  
Data may be parallel-loaded into the test data registers selected by the current instruction. If the  
instruction does not call for a parallel load or the selected register does not allow parallel loads, the test  
register will remain at its current value. On the rising edge of JTCLK, the controller will go to the Shift-  
DR state if JTMS is LOW or it will go to the Exit1-DR state if JTMS is HIGH.  
Shift-DR  
The test data register selected by the current instruction will be connected between JTDI and JTDO and  
will shift data one stage towards its serial output on each rising edge of JTCLK. If a test register selected  
by the current instruction is not placed in the serial path, it will maintain its previous state.  
Exit1-DR  
While in this state, a rising edge on JTCLK will put the controller in the Update-DR state, which  
terminates the scanning process, if JTMS is HIGH. A rising edge on JTCLK with JTMS LOW will put  
the controller in the Pause-DR state.  
Pause-DR  
Shifting of the test registers is halted while in this state. All test registers selected by the current  
instruction will retain their previous state. The controller will remain in this state while JTMS is LOW. A  
rising edge on JTCLK with JTMS HIGH will put the controller in the Exit2-DR state.  
Exit2-DR  
A rising edge on JTCLK with JTMS HIGH while in this state will put the controller in the Update-DR  
state and terminate the scanning process. A rising edge on JTCLK with JTMS LOW will enter the Shift-  
DR state.  
Update-DR  
A falling edge on JTCLK while in the Update-DR state will latch the data from the shift register path of  
the test registers into the data output latches. This prevents changes at the parallel output due to changes  
in the shift register.  
92 of 124  
 复制成功!