ABSOLUTE MAXIMUM RATINGS
OPERATING RANGES
Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C
Industrial (I) Devices
Ambient Temperature with
Power Applied . . . . . . . . . . . . . . . . . .-55°C to +125°C
Ambient Temperature (T )
A
Operating in Free Air . . . . . . . . . . . . . . -40°C to +85°C
Supply Voltage with Respect
to Ground . . . . . . . . . . . . . . . . . . . . . -0.5 V to +7.0 V
Supply Voltage (V ) with
CC
Respect to Ground. . . . . . . . . . . . . . . +4.5 V to +5.5 V
DC Input Voltage . . . . . . . . . . . .-0.5 V to V + 0.5 V
CC
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
DC Output or I/O Pin
Voltage . . . . . . . . . . . . . . . . . . .-0.5 V to V + 0.5 V
CC
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Latchup Current (T = -40°C to +85°C) . . . . . . 100 mA
A
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum Rat-
ings for extended periods may affect device reliability.
Programming conditions may vary.
DC CHARACTERISTICS OVER INDUSTRIAL OPERATING RANGES
Parameter
Symbol
Parameter Description
Output HIGH Voltage
Test Conditions
Min
Max
Unit
V
V
I
= -3.2 mA, V = V or V V = Min
IN IH IL, CC
2.4
OH
OH
V
Output LOW Voltage
I
= 16 mA, V = V or V V = Min
0.4
V
OL
OL
IN IH
IL, CC
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 1)
V
Input HIGH Voltage
2.0
V
V
IH
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 1)
V
Input LOW Voltage
0.8
IL
I
Input HIGH Leakage Current
Input LOW Leakage Current
V = V , V = Max (Note 2)
IN CC CC
10
-100
10
µA
µA
µA
µA
IH
I
V = 0 V, V = Max (Note 2)
IL
IN
CC
I
Off-State Output Leakage Current HIGH V = V , V = Max, V = V or V (Note 2)
OUT CC CC IN IL IH
OZH
I
Off-State Output Leakage Current LOW V = 0 V, V = Max, V = V or V (Note 2)
-100
OZL
OUT
CC
IN IL IH
V
= 0.5 V, V = 5 V
CC
OUT
I
Output Short-Circuit Current
Supply Current
-30
-130
mA
mA
mA
SC
T = 25°C (Note 3)
A
H-20/25
H-10/15
100
110
V = 0 V, Outputs Open
IN
(I
OUT
I
(Static)
CC
= 0 mA), V = Max
CC
V = 0 V, Outputs Open
IN
I
(Dynamic)
Supply Current
130
CC
(I = 0 mA), V = Max, f = 15 MHz
OUT
CC
Notes:
1. These are absolute values with respect to the device ground, and all overshoots due to system and tester noise are included.
2. I/O pin leakage is the worst case of I and I (or I and I ).
IL OZL IH OZH
3. Not more than one output should be tested at a time, and the duration of the short-circuit test should not exceed one second.
V
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
OUT
18
PALCE22V10H-10/15/20/25 (Ind)
LATTICE [ LATTICE SEMICONDUCTOR ]
