Specifications ispGDX80VA
Boundary Scan (Continued)
Figure 13. Boundary Scan Waveforms and Timing Specifications
TMS
TDI
T
T
bth
btsu
T
T
T
btcp
btch
btcl
TCK
TDO
T
T
T
btoz
btvo
btco
Valid Data
Valid Data
T
T
btcsu
btch
Data to be
captured
Data Captured
T
T
T
btuoz
btuov
btuco
Data to be
driven out
Valid Data
Valid Data
Symbol
Parameter
Min
100
50
50
20
25
50
–
Max Units
t
TCK [BSCAN test] clock pulse width
TCK [BSCAN test] pulse width high
TCK [BSCAN test] pulse width low
TCK [BSCAN test] setup time
–
–
ns
ns
btcp
btch
t
t
–
ns
btcl
t
t
t
t
t
t
t
t
t
t
t
–
ns
btsu
bth
TCK [BSCAN test] hold time
–
ns
TCK [BSCAN test] rise and fall time
–
mV/ns
ns
rf
TAP controller falling edge of clock to valid output
25
25
25
–
btco
btoz
btvo
btcpsu
btcph
btuco
btuoz
btuov
TAP controller falling edge of clock to data output disable
TAP controller falling edge of clock to data output enable
BSCAN test Capture register setup time
–
ns
–
ns
20
25
–
ns
BSCAN test Capture register hold time
–
ns
BSCAN test Update reg, falling edge of clock to valid output
BSCAN test Update reg, falling edge of clock to output disable
BSCAN test Update reg, falling edge of clock to output enable
50
50
50
ns
–
ns
–
ns
23
LATTICE [ LATTICE SEMICONDUCTOR ]
