欢迎访问ic37.com |
会员登录 免费注册
发布采购

1032E-80LJ 参数 Datasheet PDF下载

1032E-80LJ图片预览
型号: 1032E-80LJ
PDF下载: 下载PDF文件 查看货源
内容描述: 高密度可编程逻辑 [High-Density Programmable Logic]
分类和应用: 可编程逻辑
文件页数/大小: 16 页 / 213 K
品牌: LATTICE [ LATTICE SEMICONDUCTOR ]
 浏览型号1032E-80LJ的Datasheet PDF文件第1页浏览型号1032E-80LJ的Datasheet PDF文件第2页浏览型号1032E-80LJ的Datasheet PDF文件第3页浏览型号1032E-80LJ的Datasheet PDF文件第5页浏览型号1032E-80LJ的Datasheet PDF文件第6页浏览型号1032E-80LJ的Datasheet PDF文件第7页浏览型号1032E-80LJ的Datasheet PDF文件第8页浏览型号1032E-80LJ的Datasheet PDF文件第9页  
Specifications ispLSI and pLSI 1032E  
Switching Test Conditions  
Figure 2. Test Load  
Input Pulse Levels  
GND to 3.0V  
-125  
2 ns  
3 ns  
Input Rise and Fall Time  
10% to 90%  
+ 5V  
Others  
Input Timing Reference Levels  
Output Timing Reference Levels  
Output Load  
1.5V  
1.5V  
R
1
Device  
Output  
Test  
Point  
See Figure 2  
Table 2-0003/1032E  
3-state levels are measured 0.5V from  
steady-state active level.  
R
2
C
L
*
Output Load Conditions (see Figure 2)  
TEST CONDITION  
R1  
470Ω  
R2  
CL  
*C includes Test Fixture and Probe Capacitance.  
L
0213a  
A
B
390Ω  
390Ω  
390Ω  
35pF  
35pF  
35pF  
Active High  
Active Low  
470Ω  
Active High to Z  
at VOH-0.5V  
390Ω  
5pF  
C
Active Low to Z  
at VOL+0.5V  
470Ω  
390Ω  
5pF  
Table 2-0004/1032E  
DC Electrical Characteristics  
Over Recommended Operating Conditions  
3
SYMBOL  
PARAMETER  
Output Low Voltage  
Output High Voltage  
CONDITION  
IOL= 8 mA  
MIN.  
TYP. MAX. UNITS  
0.4  
V
V
V
OL  
IOH = -4 mA  
2.4  
V
OH  
Input or I/O Low Leakage Current  
Input or I/O High Leakage Current  
ispEN Input Low Leakage Current  
I/O Active Pull-Up Current  
0V V V (Max.)  
-10  
10  
µA  
µA  
µA  
µA  
mA  
mA  
mA  
I
I
I
I
I
IL  
IH  
IN  
IL  
3.5V V V  
IN  
CC  
0V V V  
-150  
-150  
-200  
IL-isp  
IL-PU  
OS1  
IN  
IL  
0V V V  
IN  
IL  
Output Short Circuit Current  
V = 5V, VOUT = 0.5V  
CC  
190  
190  
V = 0.5V, V = 3.0V  
Commercial  
Industrial  
CC2, 4  
IL  
IH  
Operating Power Supply Current  
I
fCLOCK = 1 MHz  
Table 2-0007/1032E  
1. One output at a time for a maximum duration of one second. VOUT = 0.5V was selected to avoid test problems  
by tester ground degradation. Characterized but not 100% tested.  
2. Measured using eight 16-bit counters.  
3. Typical values are at VCC= 5V and T = 25°C.  
A
4. Maximum ICC varies widely with specific device configuration and operating frequency. Refer to the Power Consumption  
section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to  
estimate maximum ICC  
.
4