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66WVE4M16ALL-70TLI 参数 Datasheet PDF下载

66WVE4M16ALL-70TLI图片预览
型号: 66WVE4M16ALL-70TLI
PDF下载: 下载PDF文件 查看货源
内容描述: [Pseudo Static RAM, 4MX16, 70ns, CMOS, PDSO48, TSOP1-48]
分类和应用: 光电二极管内存集成电路
文件页数/大小: 30 页 / 676 K
品牌: ISSI [ INTEGRATED SILICON SOLUTION, INC ]
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IS66WVE4M16ALL  
Advanced Information  
Low-Power Feature  
Standby Mode Operation  
During standby, the device current consumption is reduced to the level necessary to  
perform the DRAM refresh operation. Standby operation occurs when CE# and ZZ# are HIGH.  
The device will enter a reduced power state upon completion of a READ or WRITE  
operations when the address and control inputs remain static for an extended period of time.  
This mode will continue until a change occurs to the address or control inputs.  
Temperature Compensated Refresh  
Temperature compensated refresh (TCR) is used to adjust the refresh rate depending on the  
device operating temperature. DRAM technology requires more frequent refresh operations to  
maintain data integrity as temperatures increase. More frequent refresh is required due to the  
increased leakage of the DRAM's capacitive storage elements as temperatures rise. A decreased  
refresh rate at lower temperatures will result in a savings in standby current.  
TCR allows for adequate refresh at four different temperature thresholds: +15°C, +45°C, +70°C,  
and +85°C. The setting selected must be for a temperature higher than the case temperature  
of the device. If the case temperature is +50°C, the system can minimize self refresh current  
consumption by selecting the +70°C setting. The +15°C and +45°C settings would result in  
inadequate refreshing and cause data corruption.  
11  
www.issi.com - SRAM@issi.com  
Rev.00C | March 2010