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CD4027 参数 Datasheet PDF下载

CD4027图片预览
型号: CD4027
PDF下载: 下载PDF文件 查看货源
内容描述: CMOS双J-K·主从触发器 [CMOS Dual J-K Master-Slave Flip-Flop]
分类和应用: 触发器
文件页数/大小: 8 页 / 75 K
品牌: INTERSIL [ Intersil ]
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Specifications CD4027BMS  
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)  
LIMITS  
PARAMETER  
SYMBOL  
VNTH  
CONDITIONS  
VDD = 10V, ISS = -10µA  
VDD = 10V, ISS = -10µA  
NOTES  
1, 4  
TEMPERATURE  
MIN  
-2.8  
-
MAX  
-0.2  
±1  
UNITS  
o
N Threshold Voltage  
+25 C  
V
V
o
N Threshold Voltage  
Delta  
VTN  
1, 4  
+25 C  
o
P Threshold Voltage  
VTP  
VSS = 0V, IDD = 10µA  
VSS = 0V, IDD = 10µA  
1, 4  
1, 4  
+25 C  
0.2  
-
2.8  
V
V
o
P Threshold Voltage  
Delta  
VTP  
+25 C  
±1  
o
Functional  
F
VDD = 18V, VIN = VDD or GND  
VDD = 3V, VIN = VDD or GND  
VDD = 5V  
1
+25 C  
VOH >  
VDD/2  
VOL <  
VDD/2  
V
o
Propagation Delay Time  
TPHL  
TPLH  
1, 2, 3, 4  
+25 C  
-
1.35 x  
ns  
o
+25 C  
Limit  
o
NOTES: 1. All voltages referenced to device GND.  
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.  
3. See Table 2 for +25 C limit.  
4. Read and Record  
O
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25 C  
PARAMETER  
Supply Current - MSI-1  
Output Current (Sink)  
Output Current (Source)  
SYMBOL  
IDD  
DELTA LIMIT  
± 0.2µA  
IOL5  
± 20% x Pre-Test Reading  
± 20% x Pre-Test Reading  
IOH5A  
TABLE 6. APPLICABLE SUBGROUPS  
MIL-STD-883  
CONFORMANCE GROUP  
Initial Test (Pre Burn-In)  
Interim Test 1 (Post Burn-In)  
Interim Test 2 (Post Burn-In)  
PDA (Note 1)  
METHOD  
100% 5004  
100% 5004  
100% 5004  
100% 5004  
100% 5004  
100% 5004  
100% 5004  
Sample 5005  
Sample 5005  
Sample 5005  
Sample 5005  
GROUP A SUBGROUPS  
READ AND RECORD  
IDD, IOL5, IOH5A  
1, 7, 9  
1, 7, 9  
IDD, IOL5, IOH5A  
IDD, IOL5, IOH5A  
1, 7, 9  
1, 7, 9, Deltas  
Interim Test 3 (Post Burn-In)  
PDA (Note 1)  
1, 7, 9  
IDD, IOL5, IOH5A  
1, 7, 9, Deltas  
Final Test  
2, 3, 8A, 8B, 10, 11  
1, 2, 3, 7, 8A, 8B, 9, 10, 11  
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas  
1, 7, 9  
Group A  
Group B  
Subgroup B-5  
Subgroup B-6  
Subgroups 1, 2, 3, 9, 10, 11  
Subgroups 1, 2 3  
Group D  
1, 2, 3, 8A, 8B, 9  
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.  
TABLE 7. TOTAL DOSE IRRADIATION  
TEST  
READ AND RECORD  
MIL-STD-883  
METHOD  
CONFORMANCE GROUPS  
PRE-IRRAD  
POST-IRRAD  
PRE-IRRAD  
POST-IRRAD  
Table 4  
Group E Subgroup 2  
5005  
1, 7, 9  
Table 4  
1, 9  
7-784  
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