Electrical Specifications
Table 11.
GTL+ Asynchronous Signal Group DC Specifications
Symbol
Parameter
Min
Max
Unit Notes1
Input Leakage
Current
9
ILI
N/A
± 200
µA
Output Leakage
Current
10
ILO
N/A
6
± 200
12
µA
RON
Buffer On Resistance
W
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. V is defined as the voltage range at a receiving agent that will be interpreted as a logical low value.
IL
3. LINT0/INTR and LINT1/NMI use GTLREF as a reference voltage. For these two signals,
V
= GTLREF + (0.10 * V ) and V = GTLREF – (0.10 * V ).
IH
TT IL TT
4. V is defined as the voltage range at a receiving agent that will be interpreted as a logical high value.
IH
IH
5. V and V
may experience excursions above V . However, input signal drivers must comply with the signal quality
OH
TT
specifications.
6. The V referred to in these specifications refers to instantaneous V
.
TT
TT
7. All outputs are open drain.
8. The maximum output current is based on maximum current handling capability of the buffer and is not specified into
the test load.
9. Leakage to V with land held at V
.
SS
TT
10.Leakage to V with land held at 300 mV.
TT
.
Table 12.
PWRGOOD and TAP Signal Group DC Specifications
Symbol
VHYS
Parameter
Min
Max
Unit Notes1, 2
3
Input Hysteresis
120
396
mV
PWRGOOD Input low-
to-high threshold
voltage
0.5 * (VTT + VHYS_MIN
+ 0.24)
0.5 * (VTT + VHYS_MAX
+ 0.24)
4, 5
V
VT+
TAP Input low-to-high
threshold voltage
4
0.5 * (VTT + VHYS_MIN
)
0.5 * (VTT + VHYS_MAX
)
V
PWRGOOD Input high-
to-low threshold
voltage
4
0.4 * VTT
0.6 * VTT
V
VT-
TAP Input high-to-low
threshold voltage
4
0.5 * (VTT – VHYS_MAX
)
0.5 * (VTT – VHYS_MIN
)
V
4, 6
VOH
IOL
Output High Voltage
Output Low Current
Input Leakage Current
Output Leakage Current
Buffer On Resistance
N/A
—
VTT
22.2
± 200
± 200
12
V
7
mA
8
ILI
—
µA
9
ILO
—
µA
RON
6
W
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. All outputs are open drain.
3. VHYS represents the amount of hysteresis, nominally centered about 0.5 * VTT, for all TAP inputs.
4. The V referred to in these specifications refers to instantaneous V
.
TT
TT
5. 0.24 V is defined at 20% of nominal V of 1.2 V.
TT
6. The TAP signal group must meet the signal quality specifications.
7. The maximum output current is based on maximum current handling capability of the buffer and is not specified into
the test load.
8. Leakage to Vss with land held at V
.
TT
9. Leakage to V with land held at 300 mV.
TT
26
Datasheet
INTEL [ INTEL ]
