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300 参数 Datasheet PDF下载

300图片预览
型号: 300
PDF下载: 下载PDF文件 查看货源
内容描述: 赛扬D处理器 [Celeron D Processor]
分类和应用:
文件页数/大小: 95 页 / 2070 K
品牌: INTEL [ INTEL ]
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Thermal Specifications and Design Considerations  
temperature. Transistor Model parameters (Table 31) have been added to support  
thermal sensors that use the transistor equation method. The Transistor Model may  
provide more accurate temperature measurements when the diode ideality factor is  
closer to the maximum or minimum limits. This thermal "diode" is separate from the  
Thermal Monitor's thermal sensor and cannot be used to predict the behavior of the  
Thermal Monitor.  
Table 30.  
Thermal “Diode” Parameters using Diode Model  
Symbol  
IFW  
Parameter  
Min  
Typ  
Max  
Unit  
Notes  
Forward Bias Current  
Diode Ideality Factor  
Series Resistance  
5
200  
1.050  
6.24  
µA  
-
1
n
1.000  
2.79  
1.009  
4.52  
2, 3, 4  
2, 3, 5  
RT  
Ω
NOTES:  
1.  
2.  
3.  
4.  
Intel does not support or recommend operation of the thermal diode under reverse bias.  
Characterized across a temperature range of 50 - 80 °C.  
Not 100% tested. Specified by design characterization.  
The ideality factor, n, represents the deviation from ideal diode behavior as exemplified by  
the diode equation:  
I
FW = IS * (e qV /nkT –1)  
D
where IS = saturation current, q = electronic charge, VD = voltage across the diode, k = Boltzmann Constant,  
and T = absolute temperature (Kelvin).  
5.  
The series resistance, RT, is provided to allow for a more accurate measurement of the  
junction temperature. RT, as defined, includes the lands of the processor but does not  
include any socket resistance or board trace resistance between the socket and the  
external remote diode thermal sensor. RT can be used by remote diode thermal sensors  
with automatic series resistance cancellation to calibrate out this error term. Another  
application is that a temperature offset can be manually calculated and programmed into  
an offset register in the remote diode thermal sensors as exemplified by the equation:  
Terror = [RT * (N-1) * IFWmin] / [nk/q * ln N]  
where Terror = sensor temperature error, N = sensor current ratio, k = Boltzmann Constant, q = electronic  
charge.  
Table 31.  
Thermal “Diode” Parameters using Transistor Model  
Symbol  
IFW  
Parameter  
Min  
Typ  
Max  
Unit  
Notes  
Forward Bias Current  
Emitter Current  
5
200  
200  
µA  
µA  
1, 2  
IE  
5
nQ  
Transistor Ideality  
0.997  
0.391  
2.79  
1.001  
1.005  
0.760  
6.24  
3, 4, 5  
3, 4  
Beta  
RT  
Series Resistance  
4.52  
Ω
3, 6  
NOTES:  
1.  
2.  
3.  
4.  
5.  
Intel does not support or recommend operation of the thermal diode under reverse bias.  
Same as IFW in Table 30  
Characterized across a temperature range of 50 – 80 °C.  
Not 100% tested. Specified by design characterization.  
The ideality factor, nQ, represents the deviation from ideal transistor model behavior as  
exemplified by the equation for the collector current:  
/n  
I
C = IS * (e qVBE kT –1)  
Q
Where IS = saturation current, q = electronic charge, VBE = voltage across the transistor base emitter junction  
(same nodes as VD), k = Boltzmann Constant, and T = absolute temperature (Kelvin).  
The series resistance, RT, provided in the Diode Model Table (Table 30) can be used for  
more accurate readings as needed.  
6.  
82  
Datasheet