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28F800F3 参数 Datasheet PDF下载

28F800F3图片预览
型号: 28F800F3
PDF下载: 下载PDF文件 查看货源
内容描述: FAST BOOT BLOCK闪存系列8位和16 MBIT [FAST BOOT BLOCK FLASH MEMORY FAMILY 8 AND 16 MBIT]
分类和应用: 闪存
文件页数/大小: 47 页 / 274 K
品牌: INTEL [ INTEL ]
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E
FAST BOOT BLOCK DATASHEET  
CC, VPP AND RST# TRANSITIONS  
7.4.2  
V
7.3  
Standby Power  
The CUI latches commands as issued by system  
software and is not altered by VPP or CE#  
transitions or WSM actions. Its default state upon  
power-up, after exit from deep power-down mode or  
after VCC transitions above VLKO (Lockout voltage),  
is read array mode.  
With CE# at a logic-high level (VIH) and the CUI in  
read mode, the flash memory is in standby mode,  
which disables much of the device’s circuitry and  
substantially reduces power consumption. Outputs  
(DQ0–DQ15) are placed in a high-impedance state  
independent of the status of the OE# signal. If CE#  
transitions to a logic-high level during erase or  
program operations, the device will continue to  
perform the operation and consume corresponding  
active power until the operation is completed.  
After any block erase or program operation is  
complete (even after VPP transitions down to  
VPPLK), the CUI must be reset to read array mode  
via the Read Array command if access to the flash  
memory array is desired.  
System engineers should analyze the breakdown of  
standby time versus active time and quantify the  
respective power consumption in each mode for  
their specific application. This will provide a more  
accurate measure of application-specific power and  
energy requirements.  
7.5  
Power Supply Decoupling  
Flash memory’s power switching characteristics  
require careful device decoupling. System  
designers should consider three supply current  
issues:  
7.4  
Power-Up/Down Operation  
1. Standby current levels (ICCS  
)
The device is protected against accidental block  
erasure or programming during power transitions.  
Power supply sequencing is not required, since the  
2. Active current levels (ICCR  
)
3. Transient peaks produced by falling and rising  
edges of CE#.  
device is indifferent as to which power supply, VPP  
,
V
CC, or VCCQ, powers-up first.  
Transient current magnitudes depend on the device  
outputs’ capacitive and inductive loading. Two-line  
control and proper decoupling capacitor selection  
will suppress these transient voltage peaks. Each  
7.4.1  
RST# CONNECTION  
The use of RST# during system reset is important  
with automated program/erase devices since the  
system expects to read from the flash memory  
when it comes out of reset. If a CPU reset occurs  
flash device should have  
a 0.1 µF ceramic  
capacitor connected between each VCC and GND,  
and between its VPP and GND. These high-  
frequency, inherently low-inductance capacitors  
should be placed as close as possible to the  
package leads.  
without  
a
flash memory reset, proper CPU  
initialization will not occur because the flash  
memory may be providing status information  
instead of array data. Intel recommends connecting  
RST# to the system reset signal to allow proper  
CPU/flash initialization following system reset.  
7.5.1  
V
PP TRACE ON PRINTED CIRCUIT  
BOARDS  
System designers must guard against spurious  
writes when VCC voltages are above VLKO and VPP  
is active. Since both WE# and CE# must be low for  
a command write, driving either signal to VIH will  
inhibit writes to the device. The CUI architecture  
provides additional protection since alteration of  
memory contents can only occur after successful  
completion of the two-step command sequences.  
The device is also disabled until RST# is brought to  
VIH, regardless of the state of its control inputs. By  
holding the device in reset during power-up/down,  
invalid bus conditions during power-up can be  
masked, providing yet another level of memory  
protection.  
Designing for in-system writes to the flash memory  
requires special consideration of the VPP power  
supply trace by the printed circuit board designer.  
The VPP pin supplies the flash memory cells current  
for programming and erasing. VPP trace widths and  
layout should be similar to that of VCC. Adequate  
VPP supply traces, and decoupling capacitors  
placed adjacent to the component, will decrease  
spikes and overshoots.  
27  
PRODUCT PREVIEW  
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