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SAF-C167CR-LM 参数 Datasheet PDF下载

SAF-C167CR-LM图片预览
型号: SAF-C167CR-LM
PDF下载: 下载PDF文件 查看货源
内容描述: 16位CMOS单芯片微控制器 [16-Bit CMOS Single-Chip Microcontroller]
分类和应用: 微控制器和处理器外围集成电路时钟
文件页数/大小: 67 页 / 787 K
品牌: INFINEON [ Infineon ]
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C167CR  
Capture/Compare (CAPCOM) Units  
The CAPCOM units support generation and control of timing sequences on up to 32 channels with  
a maximum resolution of 400 ns (at 20-MHz system clock). The CAPCOM units are typically used  
to handle high speed I/O tasks such as pulse and waveform generation, pulse width modulation  
(PMW), Digital to Analog (D/A) conversion, software timing, or time recording relative to external  
events.  
Four 16-bit timers (T0/T1, T7/T8) with reload registers provide two independent time bases for the  
capture/compare register array.  
The input clock for the timers is programmable to several prescaled values of the internal system  
clock, or may be derived from an overflow/underflow of timer T6 in module GPT2. This provides a  
wide range of variation for the timer period and resolution and allows precise adjustments to the  
application specific requirements. In addition, external count inputs for CAPCOM timers T0 and T7  
allow event scheduling for the capture/compare registers relative to external events.  
Both of the two capture/compare register arrays contain 16 dual purpose capture/compare  
registers, each of which may be individually allocated to either CAPCOM timer T0 or T1 (T7 or T8,  
respectively), and programmed for capture or compare function. Each register has one port pin  
associated with it which serves as an input pin for triggering the capture function, or as an output pin  
(except for CC24...CC27) to indicate the occurrence of a compare event.  
When a capture/compare register has been selected for capture mode, the current contents of the  
allocated timer will be latched (‘capture’d) into the capture/compare register in response to an  
external event at the port pin which is associated with this register. In addition, a specific interrupt  
request for this capture/compare register is generated. Either a positive, a negative, or both a  
positive and a negative external signal transition at the pin can be selected as the triggering event.  
The contents of all registers which have been selected for one of the five compare modes are  
continuously compared with the contents of the allocated timers. When a match occurs between the  
timer value and the value in a capture/compare register, specific actions will be taken based on the  
selected compare mode.  
Compare Modes  
Function  
Mode 0  
Interrupt-only compare mode;  
several compare interrupts per timer period are possible  
Mode 1  
Mode 2  
Mode 3  
Pin toggles on each compare match;  
several compare events per timer period are possible  
Interrupt-only compare mode;  
only one compare interrupt per timer period is generated  
Pin set ‘1’ on match; pin reset ‘0’ on compare time overflow;  
only one compare event per timer period is generated  
Double  
Register Mode  
Two registers operate on one pin; pin toggles on each compare match;  
several compare events per timer period are possible.  
Semiconductor Group  
19  
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