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IS42S16800A-10T 参数 Datasheet PDF下载

IS42S16800A-10T图片预览
型号: IS42S16800A-10T
PDF下载: 下载PDF文件 查看货源
内容描述: 16兆×8 , 8Meg X16和4Meg ×32 128兆位同步DRAM [16Meg x 8, 8Meg x16 & 4Meg x 32 128-MBIT SYNCHRONOUS DRAM]
分类和应用: 动态存储器
文件页数/大小: 66 页 / 553 K
品牌: ICSI [ INTEGRATED CIRCUIT SOLUTION INC ]
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IS42S81600A, IS42S16800A, IS42S32400A  
IS42LS81600A, IS42LS16800A, IS42LS32400A  
ISSI  
(1,2,3)  
AC ELECTRICAL CHARACTERISTICS  
-7  
-10  
Min.  
Symbol Parameter  
Min.  
Max.  
Max  
Units  
tCK3  
tCK2  
Clock Cycle Time  
CAS Latency = 3  
CAS Latency = 2  
7
10  
10  
10  
ns  
ns  
tAC3  
tAC2  
Access Time From CLK(4)  
CAS Latency = 3  
CAS Latency = 2  
5.4  
6
7
9
ns  
ns  
tCHI  
tCL  
CLK HIGH Level Width  
CLK LOW Level Width  
Output Data Hold Time  
2.5  
2.5  
3.5  
3.5  
ns  
ns  
tOH3  
tOH2  
CAS Latency = 3  
CAS Latency = 2  
2.5  
2.5  
2.5  
2.5  
ns  
ns  
tLZ  
Output LOW Impedance Time  
0
0
ns  
tHZ3  
tHZ2  
Output HIGH Impedance Time(5)CAS Latency = 3  
CAS Latency = 2  
6
6
7
9
ns  
ns  
tDS  
Input Data Setup Time  
1.5  
0.8  
.5  
0.8  
2.0  
1
1
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tDH  
Input Data Hold Time  
tAS  
Address Setup Time  
2.0  
1
tAH  
Address Hold Time  
0.8  
1.5  
0.8  
tCKS  
tCKH  
tCKA  
tCS  
CKE Setup Time  
2.0  
1
CKE Hold Time  
CKE to CLK Recovery Delay Time  
Command Setup Time (CS, RAS, CAS, WE, DQM)  
Command Hold Time (CS, RAS, CAS, WE, DQM)  
1CLK+3  
1.5  
1CLK+3  
2.0  
tCH  
ns  
tRC  
Command Period (REF to REF / ACT to ACT)  
Command Period (ACT to PRE)  
63  
37  
120,000  
70  
44  
120,000  
ns  
ns  
ns  
ns  
ns  
ns  
tRAS  
tRP  
Command Period (PRE to ACT)  
15  
18  
tRCD  
tRRD  
tDPL3  
Active Command To Read / Write Command Delay Time  
Command Period (ACT [0] to ACT[1])  
15  
18  
14  
15  
Input Data To Precharge  
Command Delay time  
CAS Latency = 3  
2CLK  
2CLK  
tDPL2  
tDAL3  
CAS Latency = 2  
2CLK  
2CLK  
ns  
ns  
Input Data To Active / Refresh CAS Latency = 3  
Command Delay time (During Auto-Precharge)  
CAS Latency = 2  
CLK+tRP  
2CLK+tRP  
tDAL2  
tT  
2CLK+tRP  
0.5  
30  
64  
2CLK+tRP  
0.5  
30  
64  
ns  
ns  
Transition Time  
tREF  
Refresh Cycle Time (4096)  
ms  
Notes:  
1. When power is first applied, memory operation should be started 100 µs after Vdd and VddQ reach their stipulated voltages.  
Also note that the power-on sequence must be executed before starting memory operation.  
2. Measured with tT = 1 ns.  
3. The reference level is 0.9V when measuring input signal timing. Rise and fall times are measured between VIH (min.) and VIL  
(max.).  
4. Access time is measured at 0.9V with the load shown in the figure below.  
5. The time tHZ (max.) is defined as the time required for the output voltage to transition by ± 200 mV from VOH (min.) or VOL (max.)  
when the output is in the high impedance state.  
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774  
ADVANCEDINFORMATION Rev. 00A  
21  
06/01/02  
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