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IBMPPC750CLGEQ4023 参数 Datasheet PDF下载

IBMPPC750CLGEQ4023图片预览
型号: IBMPPC750CLGEQ4023
PDF下载: 下载PDF文件 查看货源
内容描述: [RISC Microprocessor, 32-Bit, 400MHz, CMOS, PBGA278, 21 X 21 MM, 1 MM PITCH, LEAD FREE, PLASTIC, MS-034, FCBGA-278]
分类和应用: 时钟外围集成电路
文件页数/大小: 70 页 / 981 K
品牌: IBM [ IBM ]
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Datasheet  
DD2.X  
PowerPC 750CL Microprocessor  
Preliminary  
5.10.3 64-Bit or 32-Bit Data Bus Mode  
The 750CL typically operates in 64-bit data bus mode. Mode setting is determined by the state of the mode  
signal, TLBISYNC, at the transition of HRESET from its active to inactive state (low to high). If TLBISYNC is  
high when HRESET transitions from active to inactive, 64-bit mode is selected. If TLBISYNC is low when  
HRESET transitions from active to inactive, 32-bit mode is selected.  
5.10.3.1 Precharge Duration Selection and Application  
An extended precharge feature is available for the signals ABB, DBB, and ARTRY in situations where the  
loading and net topology of these signals requires a longer precharge duration for the signals to attain a valid  
level.  
The bus signals, ABB, DBB, and ARTRY require a precharge to the inactive state (bus high) before going to  
tristate. The precharge duration in standard precharge mode is approximately one half cycle, and should be  
used for systems with point-to-point topologies. Extended precharge mode increases the precharge duration  
to one cycle. This increase may be required for bus speeds approaching 200 MHz when bus loading is high.  
QACK in a logical high state at the transition of HRESET from asserted to negated enables standard  
precharge mode in the 750CL. QACK in a logical low state at the transition of HRESET from asserted to  
negated enables extended precharge mode in the 750CL.  
5.11 JTAG Test Access Port (TAP) Operation  
750CL supports the IEEE 1149.1 standard, IEEE Standard Test Access Port and Boundary-Scan Architec-  
ture. The standard defines a 5-pin interface that is used to perform functions such as continuity testing  
between components on boards and system debug. Data is serially shifted into the processor through the TDI  
pin and shifted out of the processor through the TDO pin. The scan operations can be divided into two cate-  
gories: instruction scan and data scan operations. The operations or modes are selected using the TMS pin.  
Finally, all scanning and mode selection is performed synchronously with respect to the clock pin, TCK.  
This section details the IEEE 1149.1 operations supported by the 750CL processor and recommendations for  
system design to support system debug using the TAP interface. For additional details, see the IEEE 1149.1  
document.  
5.11.1 Interface Pins  
Table 5-8 provides a brief description of the five dedicated pins of the test access port (TAP). These pins do  
not have an associated boundary scan cell.  
Table 5-8. TAP Pins  
Pin  
TDI  
Input/Output  
Input  
Weak Pullup  
Mandatory TAP Pin  
Function  
Yes  
No  
Yes  
Yes  
Yes  
Yes  
No  
Serial Scan input pin  
Serial Scan output pin  
TAP controller mode pin  
Scan clock  
TDO  
TMS  
TCK  
TRST  
Output  
Input  
Yes  
No  
Input  
Input  
Yes  
TAP controller reset  
System Design Information  
Page 64 of 70  
Version 2.5  
December 2, 2008