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IBM041811QLAB-7 参数 Datasheet PDF下载

IBM041811QLAB-7图片预览
型号: IBM041811QLAB-7
PDF下载: 下载PDF文件 查看货源
内容描述: [Standard SRAM, 64KX18, 3.5ns, CMOS, PBGA119, BGA-119]
分类和应用: 静态存储器内存集成电路
文件页数/大小: 21 页 / 301 K
品牌: IBM [ IBM ]
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IBM043611QLAB  
IBM041811QLAB  
Preliminary  
32K X 36 & 64K X 18 SRAM  
IEEE 1149.1 TAP AND BOUNDARY SCAN  
The SRAM provides a limited set of JTAG functions intended to test the interconnection between SRAM I/Os  
and printed circuit board traces or other components. There is no multiplexer in the path from I/O pins to the  
RAM core.  
In conformance with IEEE std. 1149.1, the SRAM contains a TAP controller, Instruction register, Boundary  
Scan register, Bypass register and ID register.  
The TAP controller has a standard 16-state machine that resets internally upon power-up, therefore, TRST  
signal is not required.  
Signal List  
• TCK: Test Clock  
• TMS: Test Mode Select  
• TDI: Test Data In  
• TDO: Test Data Out  
Caution: TCK, TMS, TDI inputs must be biased to a valid logic level, even if JTAG is not used.  
JTAG Recommended DC Operating Conditions (T =0 to 70°C)  
A
Parameter  
Symbol  
VIH1  
Min.  
2.2  
-0.3  
2.4  
Typ.  
Max.  
VDD+0.3  
0.8  
Units  
Notes  
1
JTAG Input High Voltage  
JTAG Input Low Voltage  
JTAG Output High Level  
JTAG Output Low Level  
V
V
V
V
VIL1  
1
VOH1  
VOL1  
1, 2  
1, 3  
0.4  
1. All JTAG Inputs/Outputs are LVTTL Compatible only.  
2. IOH1 = -8mA at 2.4V.  
3. IOL1 = +8mA at 0.4V.  
JTAG AC Test Conditions (T =0 to +70°C, V =3.3 -5% + 10% V)  
A
DD  
Symbol  
Parameter  
Conditions  
Units  
V
Notes  
VIH1  
VIL1  
TR1  
TF1  
Input Pulse High Level  
Input Pulse Low Level  
Input Rise Time  
3.0  
0.0  
2.0  
2.0  
1.5  
V
ns  
ns  
V
Input Fall Time  
Input and Output Timing Reference Level  
1. See AC Test Loading on page 8.  
1
©IBM Corporation, 1996. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
03H9040  
SA14-4659-04  
Revised 7/96  
Page 13 of 21