IBM0165165B
IBM0165165P
4M x 16 12/10 EDO DRAM
ADVANCED
Read Cycle
-50
-60
Symbol
Parameter
Access Time from RAS
Units
Notes
Min.
—
Max.
50
Min.
—
Max.
60
tRAC
tCAC
tAA
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
1, 2, 3, 5
1, 2, 5
1, 2, 5
1, 5
Access Time from CAS
—
—
—
0
13
25
13
—
—
—
—
—
13
—
13
—
—
—
—
—
0
15
30
15
—
—
—
—
—
15
—
15
—
—
Access Time from Address
tOEA
tRCS
tRCH
tRRH
tRAL
tCLZ
tOEZ
tCDD
tOFF
tOES
tORD
Access Time From OE
Read Command Setup Time
Read Command Hold Time to CAS
Read Command Hold Time to RAS
Column Address to RAS Lead Time
CAS to Output in Low-Z
0
0
6
0
0
25
0
30
0
1
5
7
4
7
Output Buffer Turn-Off Delay From OE
CAS to DIN Delay Time
0
0
13
0
15
0
Output Buffer Turn-Off Delay
OE Setup Time Prior to CAS
OE Setup Time Prior to RAS (Hidden Refresh)
5
5
0
0
1. In a Test Mode Read cycle, the value of tRAC, tAA, tCAC and tCPA are delayed by 5ns from the specified value. These parameters
must be adjusted in Test Mode cycles by adding 5ns to the specified value. Associated timings must also be adjusted by 5ns.
2. Operation within the tRCD(max.) limit ensures that tRAC(max.) can be met. tRCD(max.) is specified as a reference point only. If tRCD
is greater than the specified tRCD(max.) limit, then access time is controlled by tCAC
.
3. Operation within the tRAD(max.) limit ensures that tRAC(max.) can be met. tRAD(max.) is specified as a reference point only. If tRAD is
greater than the specified tRAD(max.) limit, then access time is controlled by tAA
.
4. Either tCDD or tODD must be satisfied.
5. Measured with the specified current load and 100pF.
6. Either tRCH or tRRH must be satisfied for a read cycle.
7. tOFF(max.) and tOEZ(max.) define the time at which the output achieves the open circuit condition and are not referenced to output
voltage levels.
©IBM Corporation.. All rights reserved.
Use is further subject to the provisions at the end of this document.
27H6253
SA14-4239-02
10/96
Page 8 of 31
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