HT48R50A-1/HT48C50-1
Test Conditions
Conditions
Symbol
Parameter
I/O Port Source Current
Pull-high Resistance
Min.
Typ.
Max.
Unit
VDD
3V
5V
3V
5V
V
OH=0.9VDD
mA
mA
kW
kW
-2
-5
20
10
-4
-10
60
¾
¾
IOH
VOH=0.9VDD
100
50
¾
¾
RPH
30
A.C. Characteristics
Ta=25°C
Test Conditions
Conditions
Symbol
Parameter
Min.
Typ.
Max.
Unit
VDD
¾
2.2V~5.5V
3.3V~5.5V
2.2V~5.5V
3.3V~5.5V
3.2MHz
1.6MHz
800kHz
400kHz
2.2V~5.5V
3.3V~5.5V
¾
400
400
400
400
1800
900
450
225
0
4000
8000
4000
8000
5400
2700
1350
675
kHz
kHz
kHz
kHz
kHz
kHz
kHz
kHz
kHz
kHz
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
90
65
23
17
fSYS1
System Clock (Crystal OSC)
System Clock (RC OSC)
¾
¾
fSYS2
¾
System Clock
fSYS3
5V
(Internal RC OSC)
4000
8000
180
¾
¾
fTIMER
Timer I/P Frequency (TMR)
Watchdog Oscillator Period
0
3V
5V
3V
5V
45
ms
ms
tWDTOSC
32
130
¾
11
46
ms
ms
Watchdog Time-out Period
(WDT OSC)
Without WDT
prescaler
tWDT1
8
33
Watchdog Time-out Period
(System Clock)
Without WDT
prescaler
tWDT2
tWDT3
tRES
*tSYS
ms
1024
7.812
¾
¾
¾
¾
¾
¾
1
¾
¾
¾
Watchdog Time-out Period
(RTC OSC)
Without WDT
prescaler
External Reset Low Pulse
Width
¾
ms
tSST
tINT
tSYS
System Start-up Timer Period
Interrupt Pulse Width
Wake-up from HALT
1024
¾
¾
¾
¾
¾
1
¾
¾
ms
Note: *tSYS= 1/fSYS1, 1/fSYS2 or 1/fSYS3
Rev. 2.00
5
March 8, 2006
HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
