HT46R068B/HT46R069B
Enhanced A/D Type 8-bit OTP MCU
A.C. Characteristics
Ta=ꢃ5°C
Test Conditions
Symbol
Parameter
Min.
Typ.
Max.
Unit
VDD
Conditions
ꢃ.ꢃV~5.5V
3ꢃ
3ꢃ
—
—
—
4
4000
8000
1ꢃ000
+ꢃ%
+ꢃ%
+ꢃ%
+5%
+5%
+5%
+8%
+8%
+8%
+8%
+1ꢃ%
+1ꢃ%
+1ꢃ%
+1ꢃ%
+ꢃ%
+5%
+7%
+11%
—
kHz
kHz
fSYS
Sꢂstem Clock
—
3.0V~5.5V
4.5V~5.5V
3ꢃ
kHz
3V/5V Ta=ꢃ5°C
3V/5V Ta=ꢃ5°C
-ꢃ%
-ꢃ%
-ꢃ%
-5%
-5%
-5%
-8%
-8%
-8%
-8%
-1ꢃ%
-1ꢃ%
-1ꢃ%
-1ꢃ%
-ꢃ%
-5%
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
Hz
8
5V
Ta=ꢃ5°C
1ꢃ
4
3V/5V Ta=0~70°C
3V/5V Ta=0~70°C
8
5V
Ta=0~70°C
1ꢃ
4
ꢃ.ꢃV~3.ꢄV Ta=0~70°C
3.0V~5.5V Ta=0~70°C
3.0V~5.5V Ta=0~70°C
4.5V~5.5V Ta=0~70°C
ꢃ.ꢃV~3.ꢄV Ta=-40°C~85°C
3.0V~5.5V Ta=-40°C~85°C
3.0V~5.5V Ta=-40°C~85°C
4.5V~5.5V Ta=-40°C~85°C
fHIRC Sꢂstem Clock (HIRC)
4
8
1ꢃ
4
4
8
1ꢃ
4
5V
5V
5V
Ta=ꢃ5°Cꢅ R=1ꢃ0KΩ*
Ta=0~70°Cꢅ R=1ꢃ0KΩ*
4
fERC
Sꢂstem Clock (ERC)
Sꢂstem Clock (LXT)
Ta=-40°C~85°Cꢅ R=1ꢃ0KΩ* -7%
4
ꢃ.ꢃV~5.5V Ta=-40°C~85°Cꢅ R=1ꢃ0KΩ* -11%
4
fLXT
—
—
—
0
3ꢃ7ꢄ8
—
—
—
10
13
ꢃ.ꢃV~5.5V
3.0V~5.5V
4.5V~5.5V
4000
8000
1ꢃ000
15
kHz
Timeꢁ Inpꢀt Fꢁeqꢀencꢂ
(TCn)
tTIMER
—
0
kHz
0
kHz
3V
5V
—
—
5
kHz
fLIRC LIRC Oscillatoꢁ
Exteꢁnal Reset Low Pꢀlse
ꢄ.5
19.5
kHz
tRES
—
—
1
—
—
μs
Width
Foꢁ HXT/LXT
—
—
—
1
1ꢃ04
ꢃ
10ꢃ4
—
—
—
—
—
tSYS
tSYS
tSYS
μs
tSST
Sꢂstem Staꢁt-ꢀp time Peꢁiod
—
Foꢁ ERC/IRC
(By configuration option)
tINT
Inteꢁꢁꢀpt Fꢀlse Width
—
—
—
—
—
—
tLVR
Low Voltage Width to Reset
0.ꢃ5
—
1
ꢃ
ms
ms
RESTD Reset Delaꢂ Time
100
—
Note: 1. tSYS=1/fSYS
2.*For fREC, as the resistor tolerance will influence the frequency a percision resistor is recommended.
3. To maintain the accuracy of the internal HIRC oscillator frequency, a 0.1μF decoupling capacitor should
be connected between VDD and VSS and located as close to the device as possible.
Rev. 1.00
9
�anꢀaꢁꢂ ꢃꢄꢅ ꢃ011
HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
