HT46R068B/HT46R069B
Enhanced A/D Type 8-bit OTP MCU
Test Conditions
Symbol
Parameter
Min.
Typ.
Max.
Unit
VDD
—
Conditions
4.4
VLVD1 Low Voltage Detectoꢁ Voltage 1
VLVDꢃ Low Voltage Detectoꢁ Voltageꢃ
VLVDꢃ Low Voltage Detectoꢁ Voltage3
VLVD
VLVD
VLVD
=
=
=
V
V
V
4.1ꢃ
3.1ꢃ
ꢃ.08
4
4.4
3.3
ꢃ.ꢃ
8
4.70
3.50
ꢃ.3ꢃ
—
V
3.3
2.2
—
V
—
V
3V
5V
3V
5V
mA
mA
mA
mA
mA
kΩ
kΩ
μA
μA
μA
μA
VDD
I/O Poꢁt Sink Cꢀꢁꢁent
IOL1
VOL=0.1VDD
VOH=0.9VDD
(PAꢅ PBꢅ PCꢅ PDꢅ PEꢅ PFꢅ PGꢅ PH)
10
ꢃ0
—
-ꢃ
-4
—
IOH
IOLꢃ
RPH
I/O Poꢁt Soꢀꢁce Cꢀꢁꢁent
PA7 Sink Cꢀꢁꢁent
-5
-10
3
—
5V VOL=0.1VDD
ꢃ
—
3V
5V
—
—
ꢃ0
ꢄ0
100
50
Pꢀll-high Resistance
10
30
SCOMCꢅ ISEL[1:0]=00
SCOMCꢅ ISEL[1:0]=01
SCOMCꢅ ISEL[1:0]=10
SCOMCꢅ ISEL[1:0]=11
17.5
35
ꢃ5.0
50
3ꢃ.5
ꢄ5
ISCOM SCOM Opeꢁating Cꢀꢁꢁent
VSCOM VDD/ꢃ Voltage foꢁ LCD COM
5V
70
100
ꢃ00
0.500
130
ꢃꢄ0
0.5ꢃ5
140
0.475
5V No load
Note: The standby current (ISTB1~ISTB3) and IDD4 are measured with all I/O pins in input mode and tied to VDD
.
Rev. 1.00
8
�anꢀaꢁꢂ ꢃꢄꢅ ꢃ011
HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
