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HT46CU25 参数 Datasheet PDF下载

HT46CU25图片预览
型号: HT46CU25
PDF下载: 下载PDF文件 查看货源
内容描述: A / D型8位MCU [A/D Type 8-Bit MCU]
分类和应用:
文件页数/大小: 63 页 / 474 K
品牌: HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
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HT46RU25/HT46CU25  
Pin Description  
Pin Name  
I/O  
Options  
Description  
PA0~PA2  
PA3/PFD  
PA4  
Bidirectional 8-bit input/output port. Each bit can be configured as wake-up  
input by option (bit option). Software instructions determine the CMOS out-  
put or Schmitt trigger input with or without pull-high resistor (determine by  
Pull-high  
Wake-up  
I/O  
PA5/INT  
PA6/SDA  
PA7/SCL  
PA3 or PFD pull-high options: bit option). The PFD and INT are pin-shared with PA3  
I/O or I2C Bus and PA5, respectively. Once the I2C Bus function is used, the internal reg-  
isters related to PA6 and PA7 cannot be used.  
Bidirectional 8-bit input/output port. Software instructions determine the  
CMOS output, Schmitt trigger input with or without pull-high resistor (deter-  
PB0/AN0~  
PB7/AN7  
I/O  
Pull-high  
mined by pull-high option: bit option) or A/D input. Once a PB line is se-  
lected as an A/D input (by using software control), the I/O function and  
pull-high resistor are automatically disabled.  
Bidirectional 8-bit input/output port. Software instructions determine the  
CMOS output, Schmitt trigger input with or without pull-high resistor (deter-  
mine by pull-high option: byte option).  
PC0/TX  
PC1/RX  
Pull-high  
TX and RX are pin-shared with PC0 and PC1, once the UART Bus function  
is used, the internal registers related to PC0 and PC1 cannot be used.  
Software instructions determine the UART function to be used.  
OSC3/OSC4 are pin shared with PC6/PC7. (depending on the OSC type  
option)  
PC2~PC5  
PC6/OSC3  
PC7/OSC4  
I/O I/O or UART  
OSC3/OSC4  
PD0/PWM0  
PD1/PWM1  
PD2/PWM2  
PD3/PWM3  
PD4~PD7  
Bidirectional 8-bit input/output port. Software instructions determine the  
CMOS output, Schmitt trigger input with or without a pull-high resistor (de-  
termined by pull-high option: byte option). The PWM0/PWM1/PWM2/  
PWM3 output function are pin-shared with PD0/PD1/PD2/PD3 (depending  
on the PWM options).  
Pull-high  
I/O  
PWM  
Bidirectional 8-bit input/output port. Software instructions determine the  
CMOS output, Schmitt trigger input with or without pull-high resistor (deter-  
mine by pull-high option: byte option).  
PF0~PF7  
I/O  
I/O  
Pull-high  
Pull-high  
Bidirectional 8-bit input/output port. Software instructions determine the  
CMOS output, Schmitt trigger input with or without pull-high resistor (deter-  
mine by pull-high option: byte option).  
PG0~PG7  
(56-pin package only)  
TMR0  
TMR1  
TMR2  
RES  
I
I
Timer/Event Counter 0 Schmitt trigger input (without pull-high resistor)  
Timer/Event Counter 1 Schmitt trigger input (without pull-high resistor).  
Timer/Event Counter 2 Schmitt trigger input (without pull-high resistor).  
Schmitt trigger reset input, active low  
¾
¾
¾
¾
¾
¾
I
I
VSS  
Negative power supply, ground  
¾
¾
VDD  
Positive power supply  
OSC1 and OSC2 are connected to an RC network or a crystal (by options)  
for the internal system clock. In the case of RC operation, OSC2 is the  
output terminal for 1/4 system clock.  
OSC1  
OSC2  
I
Crystal  
or RC  
O
Absolute Maximum Ratings  
Supply Voltage...........................VSS-0.3V to VSS+6.0V  
Input Voltage..............................VSS-0.3V to VDD+0.3V  
Storage Temperature............................-50°C to 125°C  
Operating Temperature...........................-40°C to 85°C  
IOH Total............................................................-100mA  
I
OL Total ..............................................................150mA  
Total Power Dissipation .....................................500mW  
Note: These are stress ratings only. Stresses exceeding the range specified under ²Absolute Maximum Ratings² may  
cause substantial damage to the device. Functional operation of this device at other conditions beyond those  
listed in the specification is not implied and prolonged exposure to extreme conditions may affect device  
reliability.  
Rev. 1.30  
4
March 9, 2007