欢迎访问ic37.com |
会员登录 免费注册
发布采购

MKL24Z32VFM4 参数 Datasheet PDF下载

MKL24Z32VFM4图片预览
型号: MKL24Z32VFM4
PDF下载: 下载PDF文件 查看货源
内容描述: KL24子系列数据手册 [KL24 Sub-Family Data Sheet]
分类和应用:
文件页数/大小: 48 页 / 1579 K
品牌: FREESCALE [ Freescale ]
 浏览型号MKL24Z32VFM4的Datasheet PDF文件第26页浏览型号MKL24Z32VFM4的Datasheet PDF文件第27页浏览型号MKL24Z32VFM4的Datasheet PDF文件第28页浏览型号MKL24Z32VFM4的Datasheet PDF文件第29页浏览型号MKL24Z32VFM4的Datasheet PDF文件第31页浏览型号MKL24Z32VFM4的Datasheet PDF文件第32页浏览型号MKL24Z32VFM4的Datasheet PDF文件第33页浏览型号MKL24Z32VFM4的Datasheet PDF文件第34页  
Peripheral operating requirements and behaviors  
6.4.1.2 Flash timing specifications — commands  
Table 16. Flash command timing specifications  
Symbol Description  
Min.  
Typ.  
Max.  
60  
Unit  
μs  
Notes  
trd1sec1k Read 1s Section execution time (flash sector)  
1
1
1
tpgmchk  
trdrsrc  
tpgm4  
Program Check execution time  
Read Resource execution time  
Program Longword execution time  
Erase Flash Sector execution time  
Read 1s All Blocks execution time  
Read Once execution time  
45  
μs  
30  
μs  
65  
14  
145  
114  
1.8  
25  
μs  
tersscr  
trd1all  
ms  
ms  
μs  
2
1
trdonce  
tpgmonce Program Once execution time  
65  
62  
μs  
tersall  
Erase All Blocks execution time  
500  
30  
ms  
μs  
2
1
tvfykey  
Verify Backdoor Access Key execution time  
1. Assumes 25MHz flash clock frequency.  
2. Maximum times for erase parameters based on expectations at cycling end-of-life.  
6.4.1.3 Flash high voltage current behaviors  
Table 17. Flash high voltage current behaviors  
Symbol  
Description  
Min.  
Typ.  
Max.  
Unit  
IDD_PGM  
Average current adder during high voltage  
flash programming operation  
2.5  
6.0  
mA  
IDD_ERS  
Average current adder during high voltage  
flash erase operation  
1.5  
4.0  
mA  
6.4.1.4 Reliability specifications  
Table 18. NVM reliability specifications  
Symbol Description  
Min.  
Program Flash  
Typ.1  
Max.  
Unit  
Notes  
tnvmretp10k Data retention after up to 10 K cycles  
tnvmretp1k Data retention after up to 1 K cycles  
nnvmcycp Cycling endurance  
5
50  
years  
years  
cycles  
20  
100  
50 K  
10 K  
2
1. Typical data retention values are based on measured response accelerated at high temperature and derated to a constant  
25°C use profile. Engineering Bulletin EB618 does not apply to this technology. Typical endurance defined in Engineering  
Bulletin EB619.  
2. Cycling endurance represents number of program/erase cycles at -40°C ≤ Tj ≤ 125°C.  
KL24 Sub-Family Data Sheet Data Sheet, Rev. 3, 9/19/2012.  
30  
Freescale Semiconductor, Inc.