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2.15 TEST SIGNALS
The following signals are used with the on-board test logic defined by the IEEE 1149.1
standard. See Section 9 IEEE 1149.1 Test Access Port for more information on the use
of these signals.
2.15.1 Test Clock (TCK)
This input provides a clock for on-board test logic defined by the IEEE 1149.1 standard.
2.15.2 Test Mode Select (TMS)
This input controls test mode operations for on-board test logic defined by the IEEE
1149.1 standard.
2.15.3 Test Data In (TDI)
This input is used for serial test instructions and test data for on-board test logic defined
by the IEEE 1149.1 standard.
2.15.4 Test Data Out (TDO)
This output is used for serial test instructions and test data for on-board test logic defined
by the IEEE 1149.1 standard.
2.16 SYNTHESIZER POWER (V
)
CCSYN
This pin supplies a quiet power source to the VCO to provide greater frequency stability. It
is also used to control the synthesizer mode after reset. See Section 4 System
Integration Module for more information.
2.17 SYSTEM POWER AND GROUND (V
AND GND)
CC
These pins provide system power and ground to the MC68340. Multiple pins are provided
for adequate current capability. All power supply pins must have adequate bypass
capacitance for high-frequency noise suppression.
2.18 SIGNAL SUMMARY
Table 2-5 presents a summary of all the signals discussed in the preceding paragraphs.
MOTOROLA
MC68340 USER’S MANUAL
2- 13
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