MC33910BAC / MC34910BAC
ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
TIMING DIAGRAMS
33910
TRANSIENT PULSE
GENERATOR
1.0 nF
LIN
(
NOTE
)
GND
PGND LGND AGND
NOTE: Waveform Per ISO 7637-2. Test Pulses 1, 2, 3a, 3b.
Figure 25. Test Circuit for Transient Test Pulses (LIN)
33910
TRANSIENT PULSE
GENERATOR
(NOTE)
1.0 nF
L1
10 kΩ
GND
PGND LGND AGND
NOTE: Waveform Per ISO 7637-2. Test Pulses 1, 2, 3a, 3b.
Figure 26. Test Circuit for Transient Test Pulses (L1)
VSUP
R0
LIN
TXD
RXD
R0 AND C0 COMBINATIONS:
• 1.0 kΩ and 1.0 nF
• 660 Ω and 6.8 nF
• 500 Ω and 10 nF
C0
Figure 27. Test Circuit for LIN Timing Measurements
33910
Analog Integrated Circuit Device Data
Freescale Semiconductor
62