ELECTRICAL CHARACTERISTICS
TYPICAL ELECTRICAL CHARACTERISTICS
t
< 50 ns
50%
< 50 ns
3.3/5.0 V
t
R(DI)
F(DI
V
= 5.0 V
DD
0.7 V
DD
0.2 V
SCLK
DD
0 V
33879
Under
Test
DO
C = 200 pF
SCLK
V
OH
0.7 V
DD
L
DO
0.2 V
0.7 V
DD
V
V
OL
t
(Low-to-High)
DO
R(DO
t
VALID
0.2
OH
(High-to-Low)
DD
NOTE: C represents the total capacitance of the test
L
V
fixture and probe.
OL
Figure 5. Valid Data Delay Time
and Valid Time Test Circuit
Figure 6. Valid Data Delay Time
and Valid Time Waveforms
t
t
F(CS)
R(CS)
<50 ns
<50 ns
0.7 V
3.3/5.0 V
0 V
90%
10%
CS
DO
DD
0.2 V
DD
t
t
DO(EN)
DO(DIS)
V
Tri-State
90%
(Tri-StatetoLow)
10%
V
OL
t
t
DO(EN)
DO(DIS)
V
V
OH
90%
Tri-State
DO
10%
(Tri-State to High)
Figure 7. Enable and Disable Time Waveforms
TYPICAL ELECTRICAL CHARACTERISTICS
7
20
19
18
17
16
15
14
V
@ 13 V
PWR
V
@ 18 V
PWR
6
5
4
3
2
1
33879
33879A
-40 -25
0
25
50
75
100 125
-40 -25
0
25
A, Ambient Temperature (ℜ°C
Figure 8. IPWR vs. Temperature
50
75
100 125
TA, Ambient Temperature (ℜ°C
T
Figure 9. Sleep State IPWR vs. Temperature
33879
Analog Integrated Circuit Device Data
Freescale Semiconductor
12
FREESCALE [ Freescale ]
