ESMT
M52D128168A
Operation Temperature Condition -40°C~85°C
BURST SEQUENCE (BURST LENGTH = 4)
Initial Adrress
Sequential
Interleave
A1
0
A0
0
0
1
2
3
1
2
3
0
2
3
0
1
3
0
1
2
0
1
2
3
1
0
3
2
2
3
0
1
3
2
1
0
0
1
1
0
1
1
BURST SEQUENCE (BURST LENGTH = 8)
Initial
Sequential
Interleave
A2
A1
A0
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
0
1
2
3
4
5
6
7
1
2
3
4
5
6
7
0
2
3
4
5
6
7
0
1
3
4
5
6
7
0
1
2
4
5
6
7
0
1
2
3
5
6
7
0
1
2
3
4
6
7
0
1
2
3
4
5
6
0
1
0
3
2
5
4
7
6
2
3
2
1
0
7
6
5
4
4
5
6
7
0
1
2
3
5
4
7
6
1
0
3
2
6
7
6
5
4
3
2
1
0
7
0
1
2
3
4
5
1
2
3
4
5
6
7
3
0
1
6
7
4
5
7
4
5
2
3
0
1
Elite Semiconductor Memory Technology Inc.
Publication Date: Sep. 2008
Revision: 1.0 10/47
ESMT [ ELITE SEMICONDUCTOR MEMORY TECHNOLOGY INC. ]
