ESMT
F49L160UA/F49L160BA
Operation Temperature condition -40°C~85°C
10. AC CHARACTERISTICS
TEST CONDITIONS
Figure 3. Test Setup
2.7K
DEVICE U NDER
TEST
+ 3 .3V
DIODE S = I N3 064
OR EQUIVAL ENT
CL
6.2K
CL = 1 00pF Including jig ca pacita nce
CL = 3 0pF for Flash de vice
Figure 4. Input Waveforms and Measurement Levels
3. 0V
0V
1. 5V
1. 5V
Test Poin t s
Inpu t
Out pu t
A C TE S TIN G
In p ut p ul s e r i s e a nd f a l l ti m e s a re
:
In p u t s a r e d r i v e n a t 3 . 0 V f o r
5 n s .
a
l o g i c " 1 " a n d 0 V f o r
a
l o g i c " 0 "
<
Elite Semiconductor Memory Technology Inc.
Publication Date : Jan. 2008
Revision: 1.4 24/51