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EDE5104AGSE-5C-E 参数 Datasheet PDF下载

EDE5104AGSE-5C-E图片预览
型号: EDE5104AGSE-5C-E
PDF下载: 下载PDF文件 查看货源
内容描述: 512M位DDR2 SDRAM [512M bits DDR2 SDRAM]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 65 页 / 657 K
品牌: ELPIDA [ ELPIDA MEMORY ]
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EDE5104AGSE, EDE5108AGSE  
Burst Read Command [READ]  
The Burst Read command is initiated by having /CS and /CAS low while holding /RAS and /WE high at the rising  
edge of the clock. The address inputs determine the starting column address for the burst. The delay from the start  
of the command to when the data from the first cell appears on the outputs is equal to the value of the read latency  
(RL). The data strobe output (DQS) is driven low 1 clock cycle before valid data (DQ) is driven onto the data bus.  
The first bit of the burst is synchronized with the rising edge of the data strobe (DQS). Each subsequent data-out  
appears on the DQ pin in phase with the DQS signal in a source synchronous manner.  
The RL is equal to an additive latency (AL) plus /CAS latency (CL). The CL is defined by the mode register set  
(MRS), similar to the existing SDR and DDR-I SDRAMs. The AL is defined by the extended mode register set  
(EMRS).  
T0  
T1  
T2  
T3  
T4  
T5  
T6  
T7  
T8  
/CK  
CK  
READ  
NOP  
Command  
<tDQSCK  
=
DQS, /DQS  
CL = 3  
RL = 3  
DQ  
out0 out1 out2 out3  
Burst Read Operation (RL = 3, BL = 4 (AL = 0 and CL = 3))  
T0  
T1  
T2  
T3  
T4  
T5  
T6  
T7  
T8  
/CK  
CK  
READ  
NOP  
Command  
<tDQSCK  
=
DQS, /DQS  
CL = 3  
RL = 3  
DQ  
out0 out1 out2 out3 out4 out5 out6 out7  
Burst Read Operation (RL = 3, BL = 8 (AL = 0 and CL = 3))  
Preliminary Data Sheet E0715E20 (Ver. 2.0)  
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