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DEI3283-SES 参数 Datasheet PDF下载

DEI3283-SES图片预览
型号: DEI3283-SES
PDF下载: 下载PDF文件 查看货源
内容描述: [DUAL ARINC 429 LINE RECEIVER]
分类和应用:
文件页数/大小: 11 页 / 590 K
品牌: DEIAZ [ Device Engineering Incorporated ]
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General Description  
The DEI3283 consists of two analog ARINC 429 receivers which take differentially encoded ARINC level data and convert it to  
serial TTL level data. The DEI3283 provides two complete analog ARINC receivers with no external components required. Input  
level shifting thin film resistors and bipolar technology allow ARINC input voltage transients up to rꢀ200V without damage to the  
DEI3283. Each channel is identical, featuring symmetrical propagation delays for better high speed performance. Input common  
mode rejection is excellent and threshold voltage is stable, independent of supply voltage. Data outputs are TTL and CMOS  
compatible. Two TTL compatible test inputs used to test the ARINC channels are available. They can be used to override the ARINC  
input data and set the channel outputs to a known state. The DEI ARINC line driver family IC’s are companion chips to the DEI3283  
line receiver. Together they provide the analog functions needed for the ARINC 429 interface.  
Functional Description  
The DEI3283 contains two discrete ARINC 429 receiver channels. Each channel contains three main sections: a resistor input  
network, a window comparator, and a logic output buffer stage. The first stage provides over voltage protection and biases the signal  
using voltage dividers and current sources, providing excellent input common mode rejection. The test inputs are provided to set the  
outputs to a predetermined state for built-in channel test capability. If the test inputs are not used, they should be grounded. The  
window comparator section detects data from the resistor input network. A LOGIC 1 corresponds to ARINC “High” state (OUTA)  
and a LOGIC 0, to ARINC “Low” state (OUTB). An ARINC “Null” state at the inputs forces both outputs to LOGIC 0. Threshold  
and hysteresis voltages are generated by a band gap voltage reference to maintain stable switching characteristics over temperature  
and power supply variations. The output stage generates a TTL compatible logic output capable of driving 3mA of load.  
Pin Assignments  
PIN  
1
NAME  
-Vs  
DESCRIPTION  
Supply Voltage (-15V)  
2
3
4
Logic Input, see functional characteristics.  
A429 INPUT, Ch 2, B Capacitor node  
A429 INPUT, Ch 2, B input  
TEST A  
CAP2B  
IN2B  
5
6
Logic Output, Ch 2, B’s output  
A429 INPUT, Ch 2, A input  
OUT2B  
IN2A  
7
A429 INPUT, Ch 2, A Capacitor node  
CAP2A  
©2012 Device Engineering Inc  
Page 2 of 11  
DS-MW-03283-01 Rev L  
12/12/2012  
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