欢迎访问ic37.com |
会员登录 免费注册
发布采购

CY7C136-45JC 参数 Datasheet PDF下载

CY7C136-45JC图片预览
型号: CY7C136-45JC
PDF下载: 下载PDF文件 查看货源
内容描述: 2K ×8双端口静态RAM [2K x 8 Dual-Port Static RAM]
分类和应用:
文件页数/大小: 15 页 / 455 K
品牌: CYPRESS [ CYPRESS SEMICONDUCTOR ]
 浏览型号CY7C136-45JC的Datasheet PDF文件第1页浏览型号CY7C136-45JC的Datasheet PDF文件第2页浏览型号CY7C136-45JC的Datasheet PDF文件第3页浏览型号CY7C136-45JC的Datasheet PDF文件第5页浏览型号CY7C136-45JC的Datasheet PDF文件第6页浏览型号CY7C136-45JC的Datasheet PDF文件第7页浏览型号CY7C136-45JC的Datasheet PDF文件第8页浏览型号CY7C136-45JC的Datasheet PDF文件第9页  
CY7C132, CY7C136
CY7C136A, CY7C142, CY7C146
Capacitance
This parameter is guaranteed but not tested.
Parameter
C
IN
C
OUT
Description
Input Capacitance
Output Capacitance
Figure 3. AC Test Loads and Waveforms
5V
OUTPUT
30 pF
INCLUDING
JIG AND
SCOPE
Equivalent to:
R2
347Ω
R1 893Ω
5V
OUTPUT
5 pF
INCLUDING
JIG AND
SCOPE
R2
347Ω
BUSY
OR
INT
R1 893Ω
5V
281Ω
Test Conditions
T
A
= 25°C, f = 1 MHz, V
CC
= 5.0V
Max
15
10
Unit
pF
pF
30 pF
(a)
THÉVENIN EQUIVALENT
(b)
3.0V
BUSY Output Load
(CY7C132/CY7C136 Only)
ALL INPUT PULSES
10%
90%
90%
10%
< 5 ns
250Ω
OUTPUT
1.4V
GND
< 5 ns
Switching Characteristics
Over the Operating Range (Speeds -15, -25, -30)
7C136-15
7C146-15
Min
Read Cycle
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
Read Cycle Time
Address to Data Valid
Data Hold from Address Change
CE LOW to Data Valid
OE LOW to Data Valid
OE LOW to Low Z
OE HIGH to High Z
CE LOW to Low Z
CE HIGH to High Z
CE LOW to Power Up
CE HIGH to Power Down
0
15
3
10
0
25
3
10
5
15
0
25
0
15
10
3
15
5
15
15
15
0
25
15
3
15
25
25
0
30
20
30
30
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Parameter
Description
7C132-25
7C136-25
7C142-25
7C146-25
Min
Max
7C132-30
7C136-30
7C142-30
7C146-30
Min
Max
Unit
Max
Shaded areas contain preliminary information.
Notes
8. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V and output loading of the specified I
OL
/I
OH,
and 30 pF load capacitance.
9. AC test conditions use V
OH
= 1.6V and V
OL
= 1.4V.
10. At any given temperature and voltage condition for any given device, t
HZCE
is less than t
LZCE
and t
HZOE
is less than t
LZOE
.
11. t
LZCE
, t
LZWE
, t
HZOE
, t
LZOE,
t
HZCE,
and t
HZWE
are tested with C
L
= 5pF as in (b) of
Transition is measured ± 500 mV from steady state
voltage.
Document #: 38-06031 Rev. *E
Page 4 of 15