D A T A S H E E T
General Description
Revision D+1 (July 2, 1999)
Third paragraph: Added 45 ns to access times.
Global
Product Selector Guide
Added references to availability of device in Known
Good Die (KGD) form.
Added the -45 speed option for V = 5.0 V 5ꢀ and
CC
the -55 speed option for V = 5.0 V 10ꢀ.
CC
Revision E (November 15, 1999)
Ordering Information
AC Characteristics—Figure 13. Program
Operations Timing and Figure 14. Chip/Sector
Erase Operations
Added “Special Designation” to “Optional Processing”
heading; added “0” for 55 ns 10ꢀ VCC, deleted burn-in.
Burn-in is available by contacting an AMD representative.
Deleted t
high.
and changed OE# waveform to start at
GHWL
Added -55 10ꢀ and -45 speed options to the list of
valid combinations. Added extended temperature
ratings to -55 5ꢀ valid combinations.
Physical Dimensions
Replaced figures with more detailed illustrations.
Table 1, Device Bus Operations
Changed the BYTE#=V input for DQ8–DQ15 during
temporary sector unprotect to “don’t care” (X).
IL
Revision E+1 (November 30, 2000)
Added table of contents. Reinserted revision summa-
ries for revisions A and B.
Figure 6. Maximum Negative Undershoot
Waveform
Revision E+2 (June 4, 2004)
Corrected figure title.
Ordering Information
Table 7, Test Specifications
Added Pb-Free OPNs
Test load capacitance: Removed 55 ns speed option
from and added -45 speed option to the 30 pF.
Revision E+3 (December 22, 2005)
DC Characteristics
Global
Removed V = V
test condition for I
– I
.
CC
CC max
CC1
CC3
Deleted 150 ns speed option and reverse TSOP pack-
age from document.
V
max is only valid for max specs.
CC
AC Characteristics
Revision E4 (May 18, 2006)
Added “Not recommended for new designs” note.
AC Characteristics
Added the -45 speed option.
Revision C+4 (August 1998)
Ordering Information
Changed t
specification to maximium value.
BUSY
Added extended temperature combinations to the -55,
10ꢀ speed option.
Revision E5 (November 1, 2006)
Deleted the -60 speed option.
Deleted “Not recommended for new designs” note and
Retired Product designation.
Revision D (January 1999)
Revision E6 (March 3, 2009)
Distinctive Characteristics
Global
Added:
Added obsolescence information.
■ 20-year data retention at 125°C
— Reliable operation for the life of the system
Revision E7 (August 3, 2009)
DC Characteristics—TTL/NMOS Compatible
Global
I
, I
, I
: Added Note 2 “Maximum I
CC1 CC2 CC3 CC
Removed obsolescence information.
specifications are tested with V = V
”.
CC
CCmax
Revision E8 (November 11, 2009)
DC Characteristics—CMOS Compatible
, I , I : Added Note 2 “Maximum I
I
Global
CC1 CC2 CC3
CC
”.
specifications are tested with V = V
CC
CCmax
Removed 120 ns speed option.
Erase and Programming Performance
Removed all commercial temperature range options.
Deleted “(4.75 V for -45 and -55xx0)” from Note 2.
40
Am29F400B
21505E8 November 11, 2009