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AM29F400BT-55SE 参数 Datasheet PDF下载

AM29F400BT-55SE图片预览
型号: AM29F400BT-55SE
PDF下载: 下载PDF文件 查看货源
内容描述: [Flash, 256KX16, 55ns, PDSO44, MO-180AAA, SOP-44]
分类和应用: 光电二极管内存集成电路
文件页数/大小: 43 页 / 860 K
品牌: CYPRESS [ CYPRESS ]
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D A T A S H E E T  
ERASE AND PROGRAMMING PERFORMANCE  
Parameter  
Typ (Note 1)  
Max (Note 2)  
Unit  
s
Comments  
Sector Erase Time  
Chip Erase Time  
1.0  
11  
7
8
Excludes 00h programming  
prior to erasure  
s
Byte Programming Time  
Word Programming Time  
300  
500  
10.8  
9.3  
µs  
µs  
s
12  
3.6  
3.1  
Excludes system level  
overhead (Note 5)  
Byte Mode  
Word Mode  
Chip Programming Time  
(Note 3)  
s
Notes:  
1. Typical program and erase times assume the following conditions: 25°C, 5.0 V VCC, 1,000,000 cycles. Additionally,  
programming typicals assume checkerboard pattern.  
2. Under worst case conditions of 90°C, VCC = 4.5 V, 1,000,000 cycles.  
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes  
program faster than the maximum program times listed.  
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.  
5. System-level overhead is the time required to execute the four-bus-cycle sequence for the program command. See Table 5  
for further information on command definitions.  
6. The device has a guaranteed minimum erase and program cycle endurance of 1,000,000 cycles.  
LATCHUP CHARACTERISTICS  
Description  
Min  
Max  
Input voltage with respect to VSS on all pins except I/O pins  
(including A9, OE#, and RESET#)  
–1.0 V  
12.5 V  
Input voltage with respect to VSS on all I/O pins  
VCC Current  
–1.0 V  
VCC + 1.0 V  
+100 mA  
–100 mA  
Includes all pins except VCC. Test conditions: VCC = 5.0 V, one pin at a time.  
TSOP AND SO PIN CAPACITANCE  
Parameter  
Symbol  
Parameter Description  
Input Capacitance  
Test Setup  
VIN = 0  
Typ  
6
Max  
7.5  
12  
Unit  
pF  
CIN  
COUT  
CIN2  
Output Capacitance  
Control Pin Capacitance  
VOUT = 0  
VIN = 0  
8.5  
7.5  
pF  
9
pF  
Notes:  
1. Sampled, not 100% tested.  
2. Test conditions TA = 25°C, f = 1.0 MHz.  
DATA RETENTION  
Parameter  
Test Conditions  
Min  
10  
Unit  
Years  
Years  
150°C  
125°C  
Minimum Pattern Data Retention Time  
20  
36  
Am29F400B  
21505E8 November 11, 2009  
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