Ultra37000 CPLD Family
DC Voltage Applied to Outputs
5.0V Device Characteristics
Maximum Ratings
in High-Z State................................................–0.5V to +7.0V
DC Input Voltage ............................................–0.5V to +7.0V
DC Program Voltage............................................. 4.5 to 5.5V
Current into Outputs .................................................... 16 mA
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Static Discharge Voltage...........................................> 2001V
(per MIL-STD-883, Method 3015)
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Latch-up Current.....................................................> 200 mA
Supply Voltage to Ground Potential............... –0.5V to +7.0V
Operating Range[2]
Range
Ambient Temperature[2]
Junction Temperature Output Condition
VCC
VCCO
Commercial
0°C to +70°C
0°C to +90°C
–40°C to +105°C
–55°C to +130°C
5V
3.3V
5V
5V ± 0.25V
5V ± 0.25V
5V ± 0.5V
5V ± 0.5V
5V ± 0.5V
5V ± 0.5V
5V ± 0.25V
3.3V ± 0.3V
5V ± 0.5V
3.3V ± 0.3V
5V ± 0.5V
3.3V ± 0.3V
Industrial
Military[3]
–40°C to +85°C
–55°C to +125°C
3.3V
5V
3.3V
5.0V Device Electrical Characteristics Over the Operating Range
Parameter
Description
Test Conditions
Min. Typ. Max. Unit
VOH
Output HIGH Voltage
VCC = Min.
VCC = Max.
IOH = –3.2 mA (Com’l/Ind)[4] 2.4
V
V
IOH = –2.0 mA (Mil)[4]
IOH = 0 µA (Com’l)[6]
IOH = 0 µA (Ind/Mil)[6]
IOH = –100 µA (Com’l)[6]
IOH = –150 µA (Ind/Mil)[6]
IOL = 16 mA (Com’l/Ind)[4]
IOL = 12 mA (Mil)[4]
2.4
VOHZ
Output HIGH Voltage with
Output Disabled[5]
4.2
4.5
V
V
3.6
V
3.6
V
VOL
Output LOW Voltage
VCC = Min.
0.5
V
0.5
V
VIH
VIL
IIX
Input HIGH Voltage
Input LOW Voltage
Input Load Current
Output Leakage Current
Guaranteed Input Logical HIGH Voltage for all Inputs[7]
Guaranteed Input Logical LOW Voltage for all Inputs[7]
VI = GND OR VCC, Bus-Hold Disabled
2.0
–0.5
–10
VCCmax
0.8
V
V
10
µA
µA
IOZ
IOS
IBHL
VO = GND or VCC, Output Disabled, Bus-Hold Disabled –50
50
OutputShortCircuitCurrent[8, 5] VCC = Max., VOUT = 0.5V
–30
+75
–160 mA
Input Bus-Hold LOW
Sustaining Current
VCC = Min., VIL = 0.8V
VCC = Min., VIH = 2.0V
VCC = Max.
µA
IBHH
Input Bus-Hold HIGH
Sustaining Current
–75
µA
+500 µA
–500 µA
IBHLO
Input Bus-Hold LOW
Overdrive Current
IBHHO
Input Bus-Hold HIGH
Overdrive Current
VCC = Max.
Notes:
2. Normal Programming Conditions apply across Ambient Temperature Range for specified programming methods. For more information on programming the
Ultra37000 Family devices, please refer to the Application Note titled “An Introduction to In System Reprogramming with the Ultra37000.”
3. T is the “Instant On” case temperature.
A
4. I = –2 mA, I = 2 mA for TDO.
OH
OL
5. Tested initially and after any design or process changes that may affect these parameters.
6. When the I/O is output disabled, the bus-hold circuit can weakly pull the I/O to above 3.6V if no leakage current is allowed. Note that all I/Os are output disabled
during ISR programming. Refer to the application note “Understanding Bus-Hold” for additional information.
7. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
8. Not more than one output should be tested at a time. Duration of the short circuit should not exceed 1 second. V
problems caused by tester ground degradation.
= 0.5V has been chosen to avoid test
OUT
Document #: 38-03007 Rev. *D
Page 14 of 64
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