CAT28C64B
*COMMENT
ABSOLUTE MAXIMUM RATINGS*
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation
of the device at these or any other conditions outside of
those listed in the operational sections of this specifica-
tion is not implied. Exposure to any absolute maximum
rating for extended periods may affect device perfor-
mance and reliability.
Temperature Under Bias ................. –55°C to +125°C
Storage Temperature....................... –65°C to +150°C
Voltage on Any Pin with
Respect to Ground(2) ........... –2.0V to +VCC + 2.0V
VCC with Respect to Ground ............... –2.0V to +7.0V
Package Power Dissipation
Capability (Ta = 25°C)................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300°C
Output Short Circuit Current(3) ........................ 100 mA
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Endurance
Min.
105
Max.
Units
Cycles/Byte
Years
Test Method
(1)
NEND
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
(1)
TDR
Data Retention
ESD Susceptibility
Latch-Up
100
(1)
VZAP
2000
100
Volts
(1)(4)
ILTH
mA
MODE SELECTION
Mode
CE
WE
OE
L
I/O
DOUT
DIN
Power
ACTIVE
ACTIVE
ACTIVE
STANDBY
ACTIVE
Read
L
L
H
Byte Write (WE Controlled)
Byte Write (CE Controlled)
Standby, and Write Inhibit
Read and Write Inhibit
H
L
X
H
H
DIN
H
X
X
High-Z
High-Z
H
CAPACITANCE T = 25°C, f = 1.0 MHz, V
= 5V
CC
A
Symbol
Test
Max.
10
Units
pF
Conditions
(1)
CI/O
Input/Output Capacitance
Input Capacitance
VI/O = 0V
VIN = 0V
(1)
CIN
6
pF
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V +0.5V, which may overshoot to V +2.0V for periods of less than 20 ns.
CC
CC
(3) Output shorted for no more than one second. No more than one output shorted at a time.
(4) Latch-up protection is provided for stresses up to 100mA on address and data pins from –1V to V +1V.
CC
Doc. No. 1011, Rev. F
3
CATALYST [ CATALYST SEMICONDUCTOR ]
