CAT25080, CAT25160
ABSOLUTE MAXIMUM RATINGS(1)
Parameters
Ratings
–65 to +150
Units
ºC
Storage Temperature
Voltage on any Pin with Respect to Ground(2)
–0.5 to VCC + 0.5
V
RELIABILITY CHARACTERISTICS(3)
Symbol
Parameter
Min
1,000,000
100
Units
(4)
NEND
Endurance
Program/ Erase Cycles
Years
TDR
Data Retention
D.C. OPERATING CHARACTERISTICS
CC = +1.8V to +5.5V, TA=-40°C to +85°C unless otherwise specified.
V
Symbol Parameter Test Conditions
Min
Max
Units
ICC
ISB1
ISB2
Supply Current
Standby Current
Standby Current
2
mA
Read, Write, VCC = 5.0V, fSCK = 10MHz,
SO open
2
4
µA
µA
¯¯
¯¯¯
VIN = GND or VCC , CS = VCC , WP = VCC,
VCC = 5.0V
¯¯
¯¯¯
VIN = GND or VCC , CS = VCC , WP = GND,
VCC = 5.0V
IL
Input Leakage Current
Output Leakage Current
Input Low Voltage
VIN = GND or VCC
-2
-1
2
1
µA
µA
V
¯¯
ILO
VIL
VIH
CS = VCC , VOUT = GND or VCC
-0.5
0.7VCC
0.3VCC
VCC + 0.5
0.4
Input High Voltage
V
VOL1 Output Low Voltage
VOH1 Output High Voltage
VOL2 Output Low Voltage
VOH2 Output High Voltage
VCC > 2.5V, IOL = 3.0mA
VCC > 2.5V, IOH = -1.6mA
VCC > 1.8V, IOL = 150µA
VCC > 1.8V, IOH = -100µA
V
VCC - 0.8V
VCC - 0.2V
V
0.2
V
V
PIN CAPACITANCE(3)
TA = 25˚C, f = 1.0MHz, VCC = +5.0V
Symbol Test
Conditions
Min
Typ
Max
8
Units
pF
COUT
CIN
Output Capacitance (SO)
¯¯
VOUT = 0V
VIN = 0V
¯¯¯ ¯¯¯¯¯
Input Capacitance (CS, SCK, SI, WP, HOLD)
8
pF
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only,
and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is
not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) The DC input voltage on any pin should not be lower than -0.5V or higher than VCC + 0.5V. During transitions, the voltage on any pin may
undershoot to no less than -1.5V or overshoot to no more than VCC + 1.5V, for periods of less than 20ns.
(3) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100 and
JEDEC test methods.
(4) Page Mode, VCC = 5V, 25°C
Doc. No. 1122 Rev. A
2
© 2006 Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
CATALYST [ CATALYST SEMICONDUCTOR ]
