ELECTRICAL SPECIFICATIONS
T
A
=T
MIN
to T
MAX
, V
DD
=+5.0 V, ƒ
S
=28 MSPS, V
IN
=0 to 4 V, V
RHS
=4.0 V, V
RLS
=0.0 V, unless otherwise specified.
PARAMETERS
Dynamic Performance
Signal-to-Noise Ratio
(without Harmonics)
ƒ
IN
= 3.58 MHz
ƒ
IN
= 10 MHz
Harmonic Distortion
ƒ
IN
= 3.58 MHz
ƒ
IN
= 10 MHz
Signal-to-Noise and Distortion
(SINAD)
ƒ
IN
= 3.58 MHz
ƒ
IN
= 10 MHz
Spurious Free Dynamic Range
ƒ
IN
= 10 MHz
Differential Phase
Differential Gain
Inputs
Logic 1 Voltage
Logic 0 Voltage
Maximum Input Current Low
Maximum Input Current High
Input Capacitance
Digital Outputs
Logic 1 Voltage
Logic 0 Voltage
CLK to Output Delay Time (t
D
)
Power Supply Requirements
Voltages
OV
DD
V
DD
Currents
I
DD
Power Dissipation
Power Supply Rejection Ratio
TEST
CONDITIONS
TEST
LEVEL
MIN
SPT7937
TYP
MAX
UNITS
V
VI
V
VI
V
VI
V
V
V
VI
VI
VI
VI
V
I
OH
= 0.5 mA
I
OL
= 1.6 mA
VI
VI
IV
IV
IV
VI
VI
V
61
65
63
–73
–72
64
62
73
0.6
0.5
–63.5
dB
dB
dB
dB
dB
dB
dB
Degree
%
V
V
µA
µA
pF
V
V
ns
V
V
mA
mW
dB
60
2.0
–10
–10
5
V
DD
– 0.5
0.4
15
3.0
4.75
5.0
5.25
40
200
0.8
+10
+10
5.0
34
170
60
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
= +25 °C, and sample tested at the
specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characteri-
zation data.
Parameter is a typical value for information purposes only.
100% production tested at T
A
= +25 °C. Parameter is guaranteed
over specified temperature range.
SPT7937
3
3/5/02
CADEKA [ CADEKA MICROCIRCUITS LLC. ]
