ELECTRICAL SPECIFICATIONS
T
A
= T
MIN
to T
MAX
, AV
CC
= +5.0 V, ƒ
CLK
= 250 MHz, V
CM
= 2.5 V, OV
DD
= 5 V, unless otherwise specified.
PARAMETERS
TEST
CONDITIONS
TEST
LEVEL
MIN
SPT7721
TYP
MAX
UNITS
Dynamic Performance
Total Harmonic Distortion (THD)
+25 °C
ƒ
IN
= 70 MHz
–40 °C to +85 °C
ƒ
IN
= 70 MHz
Signal-to-Noise and Distortion (SINAD)
+25 °C
ƒ
IN
= 70 MHz
–40 °C to +85 °C
ƒ
IN
= 70 MHz
Power Supply Requirements
AV
CC
Voltage (Analog Supply)
OV
DD
Voltage (Digital Supply)
AV
CC
Current
Power Dissipation with Internal Voltage Reference
Common Mode Reference
Voltage
Voltage Tempco
Output Impedance
Power Supply Rejection Ratio
VI
IV
VI
IV
IV
IV
VI
VI
VI
V
V
V
VI
IV
IV
IV
IV
IV
VI
VI
IV
IV
VI
VI
VI
VI
V
V
V
V
37
35
4.75
2.75
–43
–42
40
38
5.0
62
310
2.45
2.5
100
1
63
–40
–37
dB
dB
dB
dB
5.25
5.25
70
350
2.55
V
V
mA
mW
V
ppm/°C
kΩ
mV/V
mV
P-P
V
V
V
V
V
µA
µA
V
V
µA
µA
V
V
ns
ns
ns
ns
I
OUT
= ±50 µA
Clock and Reset Inputs (Differential and Single-Ended)
Differential Signal Amplitude (V
DIFF)
Differential High Input Voltage (V
IHD)
Differential Low Input Voltage (V
ILD)
Differential Common-Mode Input (V
CMD)
Single-Ended High Input Voltage (V
IH)
Single-Ended Low Input Voltage (V
IL)
V
ID
= 1.5 V
Input Current High (II
H)
V
ID
= 1.5 V
Input Current Low (II
L)
Power Down and Mode Control Inputs (Single-Ended)
High Input Voltage
Low Input Voltage
Maximum Input Current Low
Maximum Input Current High <4.0 V
Digital Outputs
Logic "1" Voltage
Logic "0" Voltage
T
R
/T
F
Data
T
R
/T
F
DCLK = (10 pF load)
OV
DD
= 3 V
OV
DD
= 5 V
I
OH
= –0.5 mA
I
OL
= +1.6 mA
10 pF load
OV
DD
= 3 V
OV
DD
= 5 V
400
1.4
0
1.2
1.8
–100
–100
2.0
0
–100
–100
20
20
5
3.9
4.1
1.2
+100
+100
AV
CC
1.0
+100
+100
10
10
OV
DD
– 0.2 OV
DD
– 0.06
0.13
3.5
2.0
1.3
0.7
0.2
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
= +25 °C, and sample tested at the
specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characteri-
zation data.
Parameter is a typical value for information purposes only.
100% production tested at T
A
= +25 °C. Parameter is guaranteed
over specified temperature range.
SPT7721
3
11/8/01
CADEKA [ CADEKA MICROCIRCUITS LLC. ]
