ELECTRICAL SPECIFICATIONS
V
CC
= ground, V
EE
= –5.2 V
±0.3
V, T
A
= T
MIN
to T
MAX
, C
C
= 0 pF, I
Set
= 1.105 mA, unless otherwise specified.
PARAMETERS
TEST
CONDITIONS
TEST
LEVEL
MIN
TYP
400
900
600
4
3
2.2
4
4.5
1.5
6
6
MAX
UNITS
MWPS
ps
ps
ns
ns
ns
ns
ns
ns
ns
pV-s
ns
MHz
ns
ns
V/µS
dB
Dynamic Characteristics
(R
L
= 37.5 ohms, C
L
= 5 pF, T
A
= +25
°C,
I
Set
= 1.105 mA)
Maximum Conversion Rate
IV
385
Rise Time
10% to 90% G.S.
IV
Rise Time
10% to 90% G.S.
IV
R
L
= 25 ohms
Current Settling Time, Clocked
To 0.2% G.S.
V
Mode (t
SI
)
Current Settling Time, Clocked
To 0.2% G.S.
V
R
L
= 25
Ω
Mode (t
SI
)
Clock to Output Delay, Clocked
IV
Mode (t
DSC
)
T
A
= T
MIN
to T
MAX
IV
Part-to-Part Clock to Output Delay
IV
Skew, Clocked Mode
T
A
= T
MIN
to T
MAX
Data to Output Delay,
IV
Transparent Mode (t
DST
)
T
A
= T
MIN
to T
MAX
IV
Glitch Energy
Area = 1/2 VT
V
Convert Pulse Width (t
PWH
, t
PWL
)
IV
1.3
Reference Bandwidth, –3 dB
V
Set-up Time, Data and Controls (t
S
)
IV
1.0
Hold Time, Data and Controls (t
H
)
IV
0.5
Slew Rate
20% to 80% G.S.
V
Clock Feedthrough
IV
3.2
4
1.25
700
–48
TEST LEVEL CODES
All electrical characteristics are subject
to the following conditions:
All parameters having min/max specifi-
cations are guaranteed. The Test Level
column indicates the specific device
testing actually performed during pro-
duction and Quality Assurance inspec-
tion. Any blank section in the data
column indicates that the specification
is not tested at the specified condition.
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
= +25
°C,
and sample tested at the
specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characteriza-
tion data.
Parameter is a typical value for information purposes only.
100% production tested at T
A
= +25
°C.
Parameter is guaranteed over
specified temperature range.
SPT5140
3
3/28/00
CADEKA [ CADEKA MICROCIRCUITS LLC. ]
