TSC2005
www.ti.com
SBAS379–DECEMBER 2006
ELECTRICAL CHARACTERISTICS
At TA = –40°C to +85°C, SNSVDD = VREF = +1.6V to +3.6V, I/OVDD = +1.2V to +3.6V, unless otherwise noted.
TSC2005
PARAMETER
TEST CONDITIONS
MIN
0
TYP
MAX
VREF
+1
UNIT
AUXILIARY ANALOG INPUT
Input voltage range
Input capacitance
Input leakage current
A/D CONVERTER
Resolution
V
12
pF
µA
–1
Programmable: 10 or 12 bits
12
Bits
Bits
No missing codes
Integral linearity
12-bit resolution
11
±1.5
–0.8 to +0.3
+3.2 to +8.9
–0.2 to 0
LSB(1)
LSB
LSB
LSB
LSB
SNSVDD = 1.6V, VREF = 1.6V
SNSVDD = 3.0V, VREF = 2.5V
SNSVDD = 1.6V, VREF = 1.6V
SNSVDD = 3.0V, VREF = 2.5V
Offset error
Gain error
+3.8 to +4.4
REFERENCE INPUT
VREF range
1.6
SNSVDD
V
Non-cont. AUX mode, SNSVDD = 3V, VREF = 2.5V,
TA = +25°C, fADC = 2MHz, fSCLK = 10MHz
VREF input current drain
5.6
1
µA
GΩ
Input impedance
A/D converter not converting
TOUCH SENSORS
PENIRQ Pull-Up Resistor, RIRQ
TA = +25°C, SNSVDD = 3V, VREF = 2.5V
51
6
kΩ
Ω
Y+, X+
Switch
On-Resistance
Y–, X–
5
Ω
Switch drivers drive current(2)
TEMPERATURE MEASUREMENT
Temperature range
100ms duration
50
mA
–40
+85
°C
Differential method(3), SNSVDD = 3V VREF = 2.5V
TEMP1(4), SNSVDD = 3V VREF = 2.5V
1.6
0.3
±2
°C/LSB
°C/LSB
°C/LSB
°C/LSB
Resolution
Differential method(3), SNSVDD = 3V VREF = 2.5V
TEMP1(4), SNSVDD = 3V VREF = 2.5V
Accuracy
±3
INTERNAL OSCILLATOR
Clock frequency, fOSC
SNSVDD = 1.6V
SNSVDD = 3.0V
SNSVDD = 1.6V
SNSVDD = 3.0V
3.6
3.8
MHz
MHz
%/°C
%/°C
0.0056
0.012
Frequency drift
DIGITAL INPUT/OUTPUT
Logic family
CMOS
1.2V ≤ I/OVDD ≤ 1.6V
1.6V ≤ I/OVDD ≤ 3.6V
1.2V ≤ I/OVDD ≤ 1.6V
1.6V ≤ I/OVDD ≤ 3.6V
SCLK pin or CS pin
0.7 × I/OVDD
I/OVDD + 0.3
V
V
VIH
VIL
2.0
–0.3
–0.3
–1
I/OVDD + 0.3
0.2 × I/OVDD
V
0.3 × I/OVDD
V
IIL
Logic level
CIN
1
10
µA
pF
V
VOH
IOH = 2 TTL loads
IOL = 2 TTL loads
Floating output
Floating output
I/OVDD – 0.2
I/OVDD
0.2
VOL
ILEAK
0
V
–1
1
µA
pF
COUT
10
Data format
Straight Binary
(1) LSB means Least Significant Bit. With VREF = +2.5V, one LSB is 610µV.
(2) Assured by design, but not tested. Exceeding 50mA source current may result in device degradation.
(3) Difference between TEMP1 and TEMP2 measurement; no calibration necessary.
(4) Temperature drift is –2.1mV/°C.
3
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