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AS8FLC1M32BQT-120/Q 参数 Datasheet PDF下载

AS8FLC1M32BQT-120/Q图片预览
型号: AS8FLC1M32BQT-120/Q
PDF下载: 下载PDF文件 查看货源
内容描述: 全封闭,多芯片模块( MCM ) 32MB, 1M ×32 , 3.0Volt引导块闪存阵列 [Hermetic, Multi-Chip Module (MCM) 32Mb, 1M x 32, 3.0Volt Boot Block FLASH Array]
分类和应用: 闪存
文件页数/大小: 27 页 / 293 K
品牌: AUSTIN [ AUSTIN SEMICONDUCTOR ]
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SEMICONDUCTOR, INC.  
FLASH  
AS8FLC1M32  
Austin Semiconductor, Inc.  
Pin Description/Assignment Table  
Signal Name  
Symbol  
Type  
Pin DEF/Package=QT Symbol  
Pin DEF/Package=H  
Description  
Address  
A0, A1, A2. A3,  
A4, A5, A6, A7  
A8, A9, A10, A11  
A12,A13,A14,A15  
A16,A17,A18,A19  
CS1\, CS2\  
Input  
8, 7, 6, 5,  
4, 3, 66, 65,  
64, 63, 62, 28,  
29,30,31,32,  
33,37,41,42  
34, 36,  
A0, A1, A2. A3,  
7, 60, 61, 62, 49, 50, Address Inputs  
51, 37, 41, 17, 16, 6,  
38, 40, 4, 18, 5, 28,  
8, 21  
A4, A5, A6, A7  
A8, A9, A10, A11  
A12,A13,A14,A15  
A16,A17,A18,A19  
CS1\, CS2\  
Chip Selects  
Input  
20, 13, 53, 46  
Active Low True Chip Selects (Enables)  
CS3\, CS4\  
WE1\, WE2\  
WE3\, WE4\  
OE\  
2, 68  
67, 38,  
39, 40  
35  
CS3\, CS4\  
WE\  
Write Enables  
Output Enable  
Reset  
Input  
Input  
Input  
Input  
Input  
29  
27  
Active Low True Write Enable(s)  
Active Low True Output Enable (x32)  
Active Low True Reset  
OE\  
RESET\  
VCC  
RESET\  
VCC  
9
12  
Power Supply  
Ground [Core]  
61,27  
1,52,18  
19, 45  
14, 54  
Power for Core and I/O  
VSS  
VSS  
Digital GND  
Data Input, Output  
I/O0,I/O1,I/O2  
I/O3,I/O4,I/O5  
Input/  
Output  
10,11,12,13,14,15,  
16,17,19,20,21,22,  
I/O0,I/O1,I/O2  
I/O3,I/O4,I/O5  
9, 10, 11, 22, 33, 32, Data Input, Output  
31, 30, 1, 2, 3, 15  
I/O6,I/O7,1/O8  
I/O9,I/O10,I/O11  
I/O12,I/O13,I/O14  
I/O15,I/O16,I/O17  
I/O18,I/O19,I/O20  
I/O21,I/O22,I/O23  
I/O24,I/O25,I/O26  
I/O27,I/O28,I/O29  
I/O30,I/O31  
23,24,25,26,60,59,  
58,57,56,55,54,53,  
51,50,49,48,47,46,  
45,44  
I/O6,I/O7,1/O8  
I/O9,I/O10,I/O11  
I/O12,I/O13,I/O14 34, 35, 36, 42, 43, 44,  
I/O15,I/O16,I/O17  
I/O18,I/O19,I/O20  
I/O21,I/O22,I/O23  
I/O24,I/O25,I/O26  
I/O27,I/O28,I/O29  
I/O30,I/O31  
26, 25, 24, 23, 42, 43  
44, 55, 66, 65, 65, 63  
55, 66, 65, 64, 63,  
34, 35, 48, 59, 58,  
57, 56  
No Connection  
NC  
OPEN  
43  
NC  
47, 52, 39  
No internal connection  
Test Conditions  
Absolute Maximum Ratings*  
Test Specifications  
-70/-90 -100/-120  
Absolute Maximum Ratings  
Parameter  
Units  
Parameter  
Symbol  
Min.  
Max.  
Units  
Output Load  
Output Load Capacitance,  
CL (including Jig)  
Input Rise and Fall Times  
Input Pulse Levels  
Input timing measurement  
reference levels  
1 TTL Gate  
-0.5  
4
V
Voltage on VDD Pin (Note 1)  
Voltage on A9, OE\,  
and RESET\ (Note 2)  
Voltage on Input Pins  
Voltage on I/O Pins  
Output Short Circuit Current  
(Note 3)  
Storage Temperature  
Operating Temperatures  
[Screening Levels]  
VCC  
-0.5  
12.5  
V
pF  
30  
100  
VCNTL  
5
ns  
V
-0.5  
-0.5  
VCC+0.5  
VDDQ+0.5  
200  
V
V
VIN  
VIO  
ISC  
0.0-3.0  
mA  
1.5  
V
V
οC  
οC  
οC  
Output timing measurement  
reference levels  
-65  
-40  
-55  
150  
85  
tSTG  
/IT  
/XT  
1.5  
125  
1.  
Minimum DC voltage on any Input or Input/Output pin is  
–0.5v. During voltage transitions, input or input/output  
pins may undershoot VSS to –2.0v for periods of up to  
20ns.  
Test Set-Up  
3.3v  
2.  
Minimum DC input/output voltage on pins A9, OE\, and  
RESET\ is-0.5v. During voltage transitions, A9, OE\, and  
RESET\ may undershoot VSS to –2.0v for periods of up to  
20ns. Maximum DC input voltage on pin A9 is +12.5v  
which may overshoot to 14.0v for periods up to 20ns.  
No more than one output may be shorted to ground at a  
time. Duration of the short circuit should not be greater  
than one (1) second.  
Device  
Under  
Test  
3.  
1N3064  
*Stress greater than those listed under ABSOLUTE  
MAXIMUM RATINGS may cause permanent damage to  
the device. This is a stress rating only and functional  
operation of the device at these or any other conditions  
greater than those indicated in the operational sections of  
this specification is not implied. Exposure to absolute  
maximum conditions for any duration or segment of time  
may affect device reliability.  
6.2K  
ohm  
CL  
1N3064  
1N3064  
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.  
AS8FLC1M32B  
Rev. 3.3 05/08  
14  
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