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AS4LC4M16_05 参数 Datasheet PDF下载

AS4LC4M16_05图片预览
型号: AS4LC4M16_05
PDF下载: 下载PDF文件 查看货源
内容描述: 4 MEG ×16 DRAM扩展数据输出( EDO ) DRAM [4 MEG x 16 DRAM Extended Data Out (EDO) DRAM]
分类和应用: 动态存储器
文件页数/大小: 25 页 / 3754 K
品牌: AUSTIN [ AUSTIN SEMICONDUCTOR ]
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DRAM  
AS4LC4M16  
Austin Semiconductor, Inc.  
retain stored data in the DRAM. The refresh requirements are  
met by refreshing all rows in the 4 Meg x 16 DRAM array at  
least once every 64ms* (4,096 rows). The recommended  
procedure is to execute 4,096 CBR REFRESH cycles, either  
uniformly spaced or grouped in bursts, every 64ms*. The  
DRAM refreshes one row for every CBR cycle. For this device,  
executing 4,096 CBR cycles will refresh the entire device. The  
CBR REFRESH will invoke the internal refresh counter for auto-  
EDO PAGE MODE (Continued)  
two methods to disable the outputs and keep them disabled  
during the CAS\ HIGH time. The first method is to have OE\  
HIGH when CAS\ transitions HIGH and keep OE\ HIGH for  
tOEHC thereafter. This will disable the DQs, and they will  
remain disabled (regardless of the state of OE\ after that point)  
until CAS\ falls again. The second method is to have OE\ LOW  
when CAS\ transitions HIGH and then bring OE\ HIGH for a  
matic RAS\ addressing. Alternatively, RAS\-ONLY  
RE-  
minimum of tOEP anytime during the CAS\ HIGH period. This  
will disable the DQs, and they will remain disabled (regardless  
of the state of OE\ after that point) until CAS\ falls again (see  
FRESH capability is inherently provided. However, with this  
method, only one row is refreshed on each cycle. JEDEC  
strongly recommends the use of CBR REFRESH for this device.  
An optional self refresh mode is also available on the “S”  
version. The self refresh feature is initiated by performing a  
Figure 3). During other cycles, the outputs are disabled at tOFF  
time after RAS\ and CAS\ are HIGH or at tWHZ after WE\  
transitions LOW. The tOFF time is referenced from the rising  
edge of RAS\ or CAS\, whichever occurs last. WE\ can also  
perform the function of disabling the output drivers under  
certain conditions, as shown in Figure 4.  
EDO-PAGE-MODE operations are always initiated with a  
row address strobed in by the RAS\ signal, followed by a  
column address strobed in by CAS\, just like for single location  
accesses. However, subsequent column locations within the  
row may then be accessed at the page mode cycle time. This is  
accomplished by cycling CAS\ while holding RAS\ LOW and  
entering new column addresses with each CAS\ cycle.  
Returning RAS\ HIGH terminates the EDO-PAGE-MODE  
operation.  
CBR Refresh cycle and holding RAS\ low for the specified tRASS  
.
The “S” option allows the user the choice of a fully static,  
low-power data retention mode or a dynamic refresh mode at  
the extended refresh period of 128ms, or 31.25µs per cycle, when  
using a distributed CBR refresh. This refresh rate can be  
applied during normal operation, as well as during a standby or  
battery backup mode.  
The self refresh mode is terminated by driving RAS\ HIGH  
for a minimum time of tRPS. This delay allows for the completion  
of any internal refresh cycles that may be in process at the time  
of the RAS\ LOW-to-HIGH transition. If the DRAM controller  
uses a distributed CBR refresh sequence, a burst refresh is not  
required upon exiting self refresh, however, if the controller is  
using RAS\ only or burst CBR refresh then a burst refresh  
DRAM REFRESH  
The supply voltage must be maintained at the specified  
levels, and the refresh requirements must be met in order to  
using tRC (MIN) is required.  
NOTES:  
*64ms for IT version, 32ms for XT version.  
AS4LC4M16  
AustinSemiconductor,Inc.reservestherighttochangeproductsorspecificationswithoutnotice.  
Rev. 1.1 6/05  
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