2. Grade 0 Qualification
The ATmega16M1/ATmega32M1/ATmega32C1/ATmega64M1/ATmega64C1 has been devel-
oped and manufactured according to the most stringent quality assurance requirements of
ISO-TS-16949 and verified during product qualification as per AEC-Q100 grade 0.
AEC-Q100 qualification relies on temperature accelerated stress testing. High temperature field
usage however may result in less significant stress test acceleration. In order to prevent the risk
that ATmega16M1/ATmega32M1/ATmega32C1/ATmega64M1/ATmega64C1 lifetime would not
satisfy the application end-of-life reliability requirements, Atmel® has extended the testing,
whenever applicable (High Temperature Operating Life Test, High Temperature Storage Life,
Data Retention, Thermal Cycles), far beyond the AEC-Q100 requirements. Thereby, Atmel veri-
fied the ATmega16M1/ATmega32M1/ATmega32C1/ATmega64M1/ATmega64C1 has a long
safe lifetime period after the grade 0 qualification acceptance limits.
The valid domain calculation depends on the activation energy of the potential failure mecha-
nism that is considered. Therefore any temperature mission profile which could exceed the
AEC-Q100 equivalence domain shall be submitted to Atmel for a thorough reliability analysis
Figure 2-1. AEC-Q100 Lifetime Equivalence
1000000
100000
10000
1000
100
10
1
0
20
40
60
Temperature (°C)
HTOL 0,59eV HTSL 0,45eV
80
100
120
140
160
6
ATmega16M1/32M1/32C1/64M1/64C1 Automotive
7781D–AVR–01/10
ATMEL [ ATMEL ]
