欢迎访问ic37.com |
会员登录 免费注册
发布采购

ATMEGA64A-AU 参数 Datasheet PDF下载

ATMEGA64A-AU图片预览
型号: ATMEGA64A-AU
PDF下载: 下载PDF文件 查看货源
内容描述: 8位微控制器,带有64K字节的系统内可编程闪存 [8-bit Microcontroller with 64K Bytes In-System Programmable Flash]
分类和应用: 闪存微控制器
文件页数/大小: 392 页 / 7964 K
品牌: ATMEL [ ATMEL ]
 浏览型号ATMEGA64A-AU的Datasheet PDF文件第268页浏览型号ATMEGA64A-AU的Datasheet PDF文件第269页浏览型号ATMEGA64A-AU的Datasheet PDF文件第270页浏览型号ATMEGA64A-AU的Datasheet PDF文件第271页浏览型号ATMEGA64A-AU的Datasheet PDF文件第273页浏览型号ATMEGA64A-AU的Datasheet PDF文件第274页浏览型号ATMEGA64A-AU的Datasheet PDF文件第275页浏览型号ATMEGA64A-AU的Datasheet PDF文件第276页  
ATmega64A  
Table 25-5. Boundary-scan Signals for the ADC(1) (Continued)  
Direction  
Output Values when  
Recommended Inputs  
are Used, and CPU is  
not Using the ADC  
as Seen  
from the  
ADC  
Recommended  
Input when not  
in Use  
Signal  
Name  
Description  
SCTEST  
Input  
Input  
Input  
Switch-cap TEST  
enable. Output from  
x10 gain stage send  
out to Port Pin having  
ADC_4  
0
0
0
0
0
0
ST  
Output of gain stages  
will settle faster if this  
signal is high first two  
ACLK periods after  
AMPEN goes high.  
VCCREN  
Selects Vcc as the  
ACC reference  
voltage.  
Note:  
1. Incorrect setting of the switches in Figure 25-10 will make signal contention and may damage  
the part. There are several input choices to the S&H circuitry on the negative input of the out-  
put comparator in Figure 25-10. Make sure only one path is selected from either one ADC pin,  
Bandgap reference source, or Ground.  
If the ADC is not to be used during scan, the recommended input values from Table 25-5 should  
be used. The user is recommended not to use the Differential Gain stages during scan. Switch-  
cap based gain stages require fast operation and accurate timing which is difficult to obtain  
when used in a scan chain. Details concerning operations of the differential gain stage is there-  
fore not provided.  
The AVR ADC is based on the analog circuitry shown in Figure 25-10 with a successive approx-  
imation algorithm implemented in the digital logic. When used in Boundary-scan, the problem is  
usually to ensure that an applied analog voltage is measured within some limits. This can easily  
be done without running a successive approximation algorithm: apply the lower limit on the digi-  
tal DAC[9:0] lines, make sure the output from the comparator is low, then apply the upper limit  
on the digital DAC[9:0] lines, and verify the output from the comparator to be high.  
The ADC needs not be used for pure connectivity testing, since all analog inputs are shared with  
a digital port pin as well.  
When using the ADC, remember the following:  
• The Port Pin for the ADC channel in use must be configured to be an input with pull-up  
disabled to avoid signal contention.  
• In Normal mode, a dummy conversion (consisting of 10 comparisons) is performed when  
enabling the ADC. The user is advised to wait at least 200 ns after enabling the ADC before  
controlling/observing any ADC signal, or perform a dummy conversion before using the first  
result.  
• The DAC values must be stable at the midpoint value 0x200 when having the HOLD signal  
low (Sample mode).  
272  
8160C–AVR–07/09  
 复制成功!