ATmega32(L)
If the ADC is not to be used during scan, the recommended input values from Table 91
should be used. The user is recommended not to use the Differential Gain stages dur-
ing scan. Switch-cap based gain stages require fast operation and accurate timing
which is difficult to obtain when used in a scan chain. Details concerning operations of
the differential gain stage is therefore not provided.
The AVR ADC is based on the analog circuitry shown in Figure 123 with a successive
approximation algorithm implemented in the digital logic. When used in Boundary-scan,
the problem is usually to ensure that an applied analog voltage is measured within some
limits. This can easily be done without running a successive approximation algorithm:
apply the lower limit on the digital DAC[9:0] lines, make sure the output from the com-
parator is low, then apply the upper limit on the digital DAC[9:0] lines, and verify the
output from the comparator to be high.
The ADC need not be used for pure connectivity testing, since all analog inputs are
shared with a digital port pin as well.
When using the ADC, remember the following:
•
The Port Pin for the ADC channel in use must be configured to be an input with pull-
up disabled to avoid signal contention.
•
In Normal mode, a dummy conversion (consisting of 10 comparisons) is performed
when enabling the ADC. The user is advised to wait at least 200 ns after enabling
the ADC before controlling/observing any ADC signal, or perform a dummy
conversion before using the first result.
•
The DAC values must be stable at the midpoint value 0x200 when having the HOLD
signal low (Sample mode).
As an example, consider the task of verifying a 1.5V 5ꢀ input signal at ADC channel 3
when the power supply is 5.0V and AREF is externally connected to VCC
.
The lower limit is:
The upper limit is:
1024 ⋅ 1,5V ⋅ 0,95 ⁄ 5V = 291 = 0x123
1024 ⋅ 1,5V ⋅ 1,05 ⁄ 5V = 323 = 0x143
The recommended values from Table 91 are used unless other values are given in the
algorithm in Table 92. Only the DAC and Port Pin values of the Scan-chain are shown.
The column “Actions” describes what JTAG instruction to be used before filling the
Boundary-scan Register with the succeeding columns. The verification should be done
on the data scanned out when scanning in the data on the same row in the table.
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2503J–AVR–10/06
ATMEL [ ATMEL ]
