TS68EN360
An approximate relationship between PD and TJ (if PI/O is neglected) is:
PD = K ÷ (TJ + 273°C)
(2)
Solving Equations (1) and (2) for K gives:
2
K = PD · (TA + 273°C) + ΘJA · PD
(3)
where K is a constant pertaining to the particular part. K can be determined from Equation (3) by
measuring PD (at thermal equilibrium) for a know TA. Using this value of K, the values of PD and
TJ can be obtained by solving Equations (1) and (2) iteratively for any value of TA.
5.4
5.5
Mechanical and Environment
The microcircuits shall meet all mechanical environmental requirements of either MIL-STD-883
for class B devices or for Atmel standard screening.
Marking
The document where are defined the marking are identified in the related reference documents.
Each microcircuit are legible and permanently marked with the following information as
minimum:
• Atmel logo
• Manufacturer’s part number
• Class B identification
• Date-code of inspection lot
• ESD identifier if available
• Country of manufacturing
6. Quality Conformance Inspection
6.1
DESC/MIL-STD-883
Is in accordance with MIL-M-38535 and method 5005 of MIL-STD-883. Group A and B inspec-
tions are performed on each production lot. Group C and D inspections are performed on a
periodical basis.
7. Electrical Characteristics
7.1
General Requirements
All static and dynamic electrical characteristics specified for inspection purposes and the rele-
vant measurement conditions are given below:
• Static electrical characteristics for the electrical variants
• Dynamic electrical characteristics for TS68EN360 (25 MHz, 33 MHz)
For static characteristics, test methods refer to IEC 748-2 method number, where existing.
For dynamic characteristics, test methods refer to clause Table 7-1 of this specification.
13
2113B–HIREL–06/05
ATMEL [ ATMEL ]
