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AMS73CAG01408RAUJH7 参数 Datasheet PDF下载

AMS73CAG01408RAUJH7图片预览
型号: AMS73CAG01408RAUJH7
PDF下载: 下载PDF文件 查看货源
内容描述: 高性能的1Gbit DDR3 SDRAM [HIGH PERFORMANCE 1Gbit DDR3 SDRAM]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 31 页 / 683 K
品牌: AMS [ Advanced Monolithic Systems Ltd ]
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AMS73CAG01808RA  
Notes for AC Electrical Characteristics  
NOTE :  
1. Actual value dependant upon measurement level definitions which are TBD.  
2. Commands requiring a locked DLL are: READ (and READA) and synchronous ODT commands.  
3. The max values are system dependent.  
4. WR as programmed in mode register.  
5. Value must be rounded-up to next higher integer value.  
6. There is no maximum cycle time limit besides the need to satisfy the refresh interval, tREFI.  
7. ODT turn on time (min.) is when the device leaves high impedance and ODT resistance begins to turn on.  
ODT turn on time (max.) is when the ODT resistance is fully on. Both are measured from ODTLon.  
8. ODT turn-off time (min.) is when the device starts to turn-off ODT resistance. ODT turn-off time (max.) is when  
the bus is in high impedance. Both are measured from ODTLoff.  
9. tWR is defined in ns, for calculation of tWRPDEN it is necessary to round up tWR / tCK to the next integer.  
10. WR in clock cycles as programmed in MR0.  
11. The maximum read postamble is bound by tDQSCK(min) plus tQSH(min) on the left side and tHZ(DQS)max on  
the right side.  
12. Output timing deratings are relative to the SDRAM input clock. When the device is operated with input clock jitter,  
this parameter needs to be derated by TBD.  
13. Value is only valid for RON34.  
14. Single ended signal parameter. Refer to the section of tLZ(DQS), tLZ(DQ), tHZ(DQS), tHZ(DQ) Notes for definition  
and measurement method.  
15. tREFI depends on operating case temperature (Tc).  
16. tIS(base) and tIH(base) values are for 1V/ns command/addresss single-ended slew rate and 2V/ns CK, CK  
differential slew rate, Note for DQ and DM signals, VREF(DC) = VREFDQ(DC). For input only pins except RESET,  
VREF(DC) = VREFCA(DC). See Address / Command Setup, Hold and Derating section.  
17. tDS(base) and tDH(base) values are for 1V/ns DQ single-ended slew rate and 2V/ns DQS, DQS differential slew  
rate. Note for DQ and DM signals,VREF(DC)= VREFDQ(DC). For input only pins except RESET, VREF(DC) =  
VREFCA(DC). See Data Setup, Hold and and Slew Rate Derating section.  
18. Start of internal write transaction is defined as follows ;  
For BL8 (fixed by MRS and on-the-fly) : Rising clock edge 4 clock cycles after WL.  
For BC4 (on-the-fly) : Rising clock edge 4 clock cycles after WL.  
For BC4 (fixed by MRS) : Rising clock edge 2 clock cycles after WL.  
19. The maximum read preamble is bound by tLZDQS(min) on the left side and tDQSCK(max) on the right side.  
20. CKE is allowed to be registered low while operations such as row activation, precharge, autoprecharge or refresh  
are in progress, but power-down IDD spec will not be applied until finishing those operation.  
21. Although CKE is allowed to be registered LOW after a REFRESH command once tREFPDEN(min) is satisfied,  
there are cases where additional time such as tXPDLL(min) is also required.  
22. Defined between end of MPR read burst and MRS which reloads MPR or disables MPR function.  
23. One ZQCS command can effectively correct a minimum of 0.5 % (ZQCorrection) of RON and RTT impedance error  
within 64 nCK for all speed bins assuming the maximum sensitivities specified in the “Output Driver Voltage and  
Temperature Sensitivity” and “ODT Voltage and Temperature Sensitivity” tables. The appropriate interval between  
ZQCS commands can be determined from these tables and other application specific parameters.  
One method for calculating the interval between ZQCS commands, given the temperature (Tdriftrate) and voltage  
(Vdriftrate) drift rates that the SDRAM is subject to in the application, is illustrated. The interval could be defined by  
the following formula:  
ZQCorrection  
(TSens x Tdriftrate) + (VSens x Vdriftrate)  
where TSens = max(dRTTdT, dRONdTM) and VSens = max(dRTTdV, dRONdVM) define the SDRAM temperature  
and voltage sensitivities.  
AMS73CAG01808RA Rev. 1.0 December 2010  
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