FS612509-01/-02
1:9 Zero-Delay Clock Buffer IC
5.0
Electrical Specifications
Table 3: Absolute Maximum Ratings
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. These conditions represent a stress rating only, and functional operation of the device at
these or any other conditions above the operational limits noted in this specification is not implied. Exposure to maximum rating conditions for extended conditions may affect device performance,
functionality, and reliability.
PARAMETER
Supply Voltage, dc, Clock Buffers (V
SS
= ground)
Supply Voltage, dc, Core
Input Voltage, dc
Output Voltage, dc
Input Clamp Current, dc (V
I
< 0 or V
I
> V
DD
)
Output Clamp Current, dc (V
I
< 0 or V
I
> V
DD
)
Storage Temperature Range (non-condensing)
Ambient Temperature Range, Under Bias
Junction Temperature
Lead Temperature (soldering, 10s)
Static Discharge Voltage Protection (MIL-STD 883E, Method 3015.7)
SYMBOL
AV
DD
V
DD
V
I
V
O
I
IK
I
OK
T
S
T
A
T
J
MIN.
V
SS
- 0.5
V
SS
- 0.5
V
SS
- 0.5
V
SS
- 0.5
-50
-50
-65
-55
MAX.
7
7
V
DD
+ 0.5
V
DD
+ 0.5
50
50
150
125
125
260
2
UNITS
V
V
V
V
mA
mA
°C
°C
°C
°C
kV
CAUTION: ELECTROSTATIC SENSITIVE DEVICE
Permanent damage resulting in a loss of functionality or performance may occur if this device is subjected to a high-energy
electrostatic discharge.
Table 4: Operating Conditions
PARAMETER
Supply Voltage, Core and Outputs
Ambient Operating Temperature Range
Output Load Capacitance
Input Frequency
Input Duty Cycle
Input Rise/Fall Time
SYMBOL
V
DD
T
A
C
L
f
CLK
CLK
CLK
CLK
50
40
CONDITIONS/DESCRIPTION
3.3V ± 10%
MIN.
3.0
0
TYP.
3.3
MAX.
3.6
70
15
140
60
3
UNITS
V
°C
pF
MHz
%
ns
ISO9001
QS9000
4
AMI [ AMI SEMICONDUCTOR ]
